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AN3324 Datasheet(PDF) 7 Page - STMicroelectronics

Part # AN3324
Description  Implementing power-on self tests
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3324 Datasheet(HTML) 7 Page - STMicroelectronics

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AN3324
How to implement power-on self test features
Doc ID 18311 Rev 2
7/37
2
How to implement power-on self test features
The goal of this application note is to show how users can implement properly the safety
initialization and the self tests to allow to detect latent fault(a) and to manage them.
2.1
MCU initialization
At power-on, after register initialization (see Section 3.3: Redundancy Control Checker Unit
(RCCU)) and other basic initializations (MMU configuration, stack initialization, etc.) (see
Appendix A: CPU core initialization) user software has to verify if MCU is in alarm state or in
safe mode (coming from a Reset Condition) (see Section B.1: Reference documents in
Appendix B) and in that case must manage fault causes.
If current mode in Mode Entry module is default run mode (DRUN), software can proceed
with the default safety MCU initialization with self test features (see Figure 1: Initialization
flow).
Note:
User can verify alarm state by reading Non Critical Fault on FCCU while he can verify safe
mode by reading Current Mode field (GS register) on Mode Entry module.
a.
Latent fault: multiple point fault whose presence is not detected by a safety mechanism nor perceived by the
driver within the multiple point fault detection interval.


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