DocID025810 Rev 3

11/17

AN4434

Data retention

16

2.2

CMOS F8H automotive process and MXXxxx-A125/A145

data retention performance

2.2.1

Data retention and temperature dependence

The CMOS F8H automotive EEPROM (MXXxxx-A125/A145) data retention is temperature

data retention time (as clearly shown in Figure 2).

Figure 2. Years of data retention versus temperature

The data retention safe values are:

•

more than 100 years (at 25°C or less)

•

more than 40 years (at 55°C)

•

more than 20 years (at 85°C)

•

•

more than 10 years (at 145°C).

2.2.2

Data retention qualification method

Data retention qualification procedure for the CMOS F8H automotive EEPROMs checks

that the data written into the EEPROM remain readable with a safe programming level. The

ST qualification method is:

–

the part is cycled according to the max cycling values defined in the data sheet, at

several temperatures,

–

–

the part content is then checked.

d. After cycling the device 100 kcycles at 150°C, the data retention safe value is 50 years (at 125°C).

0

10

20

30

40

50

60

70

80

90

100

110

-50

-30

-10

1030507090

110

130

150

Data retention (years) versus temperature (°C)

°C