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ADS58J63 Datasheet(PDF) 5 Page - Texas Instruments |
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ADS58J63 Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 87 page  ADS58J63 www.ti.com SBAS717A – JUNE 2015 – REVISED JUNE 2015 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT AVDD3V –0.3 3.6 V AVDD –0.3 2.1 V Supply voltage range: DVDD –0.3 2.1 V IOVDD –0.2 1.4 V Voltage between AGND and DGND –0.3 0.3 V INA/BP, INA/BM, INC/DP, INC/DM –0.3 3 V CLKINP, CLKINM –0.3 AVDD + 0.3 V Voltage applied to input pins SYSREFP, SYSREFM, TRIGAB, TRIGCD –0.3 AVDD + 0.3 V SCLK, SEN, SDIN, RESET, SPI_MODE, –0.2 2 V SYNCbABP/M, SYNCbCDP/M, PDN Storage temperature, Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±1 kV (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions (1) over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT AVDD3V 2.85 3 3.6 V AVDD 1.8 1.9 2 V Supply voltage range: DVDD 1.8 1.9 2 V IOVDD 1.1 1.15 1.2 V Differential input voltage range 1.9 VPP Analog inputs: Input common-mode voltage VCM ± 0.025 V Input clock frequency, device clock frequency 250 500 MHz Sine wave, ac-coupled 1.5 VPP Input clock amplitude differential Clock inputs: LVPECL, ac-coupled 1.6 VPP (VCLKP – VCLKM) LVDS, ac-coupled 0.7 VPP Input device clock duty cycle, default after reset 45% 50% 55% Operating free-air, TA –40 85 ºC Temperature: Operating junction, TJ 105(2) 125 ºC (1) SYSREF needs to be applied for the device bring up. (2) Prolonged use above this junction temperature can increase the device failure-in-time (FIT) rate. Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: ADS58J63 |
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