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ISL9007EVAL1Z Datasheet(PDF) 7 Page - Intersil Corporation |
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ISL9007EVAL1Z Datasheet(HTML) 7 Page - Intersil Corporation |
7 / 9 page ISL9007 7 FN9218.3 February 11, 2014 Functional Description The ISL9007 contains all circuitry required to implement a high performance LDO. High performance is achieved through a circuit that delivers fast transient response to varying load conditions. In a quiescent condition, the ISL9007 adjusts its biasing to achieve the lowest standby current consumption. The device also integrates current limit protection, smart thermal shutdown protection, and soft-start. Smart thermal shutdown protects the device against overheating. Soft-start minimize start-up input current surges without causing excessive device turn-on time. Power Control The ISL9007 has a shutdown pin (SD) to control power to the LDO output. When SD is high, the device is in shutdown mode. In this condition, all on-chip circuits are off, and the device draws minimum current, typically less than 0.1µA. When the SD pin goes low, the device first polls the output of the UVLO detector to ensure that the VIN voltage is at least 2.1V (typical). Once verified, the device initiates a start-up sequence. During the start-up sequence, trim settings are first read and latched. Then, sequentially, the bandgap, reference voltage and current generation circuitry turn-on. Once the references are stable, the LDO powers up. During operation, whenever the VIN voltage drops below about 1.84V, the ISL9007 immediately disables both LDO outputs. When VIN rises back above 2.1V (assuming the SD pin is low), the device re-initiates its start-up sequence and LDO operation will resume automatically. Reference Generation The reference generation circuitry includes a trimmed bandgap, a trimmed voltage reference divider, a trimmed current reference generator, and an RC noise filter. The bandgap generates a zero temperature coefficient (TC) voltage for the regulator reference and other voltage references required for current generation and over-temperature detection. A current generator provides references required for adaptive biasing as well as references for LDO output current limit and thermal shutdown determination. LDO Regulation and Programmable Output Divider The LDO Regulator is implemented with a high-gain operational amplifier driving a PMOS pass transistor. The design of the ISL9000 provides a regulator that has low quiescent current, fast transient response, and overall stability across all operating and load current conditions. LDO stability is guaranteed for a 1µF to 10µF output capacitor that has a tolerance better than 20% and ESR less than 200m Ω. The design is performance-optimized for a 1µF capacitor. Unless limited by the application, use of an output capacitor value above 4.7µF is not recommended as LDO performance improvement is minimal. Soft-start circuitry integrated into each LDO limits the initial ramp-up rate to about 30µs/V to minimize current surge. The ISL9007 provides short-circuit protection by limiting the output current to about 500mA. The LDO uses an independently trimmed 1V reference as its input. An internal resistor divider drops the LDO output voltage down to 1V. This is compared to the 1V reference for regulation. The resistor division ratio is programmed in the factory to one of the following output voltages: 3.3, 2.85V, 2.8V, and 2.5V. Overheat Detection The bandgap outputs a proportional-to-temperature current that is indicative of the temperature of the silicon. This current is compared with references to determine if the device is in danger of damage due to overheating. When the die temperature reaches about +145°C, the LDO momentarily shuts down until the die cools sufficiently. In the overheat condition, if the LDO sources more than 50mA it will be shut off. Once the die temperature falls back below about +110°C, the disabled LDO is re-enabled and soft-start automatically takes place. |
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