LM3495

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SNVS410F – FEBRUARY 2006 – REVISED APRIL 2013

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

VIN, ILIM

−0.3V to 20V

−0.5V to 20V

BOOST, HG

−0.3V to 25V

BOOST to SW

−0.3V to 6V

FB

−0.3V to 2V

TRACK, FREQ, FPWM, VLIN5, SNS, LG, CSL

−0.3V to 6V

Storage Temperature

−65°C to +150°C

Lead Temperature (soldering, 10 sec)

260°C

Soldering Information

Infrared or Convection (15 sec)

235°C

2kV

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which

operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications.

(3)

An extended negative voltage limit of –2V applies for a duration of 20 ns per switching cycle

(4)

The human body model is a 100 pF capacitor discharged through a 1.5 k

Ω resistor into each pin.

Operating Ratings

(1)

2.9V to 18V

BOOST to SW

2.5V to 5.5V

Junction Temperature

−40°C to +125°C

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which

operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.

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