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LM2700 Datasheet(PDF) 4 Page - Texas Instruments |
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LM2700 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 26 page LM2700 SNVS152C – MAY 2001 – REVISED MARCH 2013 www.ti.com Absolute Maximum Ratings (1) (2) VIN 12V SW Voltage 18V FB Voltage 7V VC Voltage 0.965V ≤ VC ≤ 1.565V SHDN Voltage(3) 7V FSLCT(3) 12V Maximum Junction Temperature 150°C Power Dissipation(4) Internally Limited Lead Temperature 300°C Vapor Phase (60 sec.) 215°C Infrared (15 sec.) 220°C ESD Susceptibility(5) Human Body Model 2kV Machine Model 200V (1) Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the device is intended to be functional, but device parameter specifications may not be ensured. For ensured specifications and test conditions, see the Electrical Characteristics. (2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications. (3) This voltage should never exceed VIN. (4) The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction-to-ambient thermal resistance, θJA, and the ambient temperature, TA. See the Electrical Characteristics table for the thermal resistance. The maximum allowable power dissipation at any ambient temperature is calculated using: PD (MAX) = (TJ(MAX) − TA)/θJA. Exceeding the maximum allowable power dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown. (5) The human body model is a 100 pF capacitor discharged through a 1.5k Ω resistor into each pin. The machine model is a 200pF capacitor discharged directly into each pin. Operating Conditions Operating Junction Temperature Range(1) −40°C to +125°C Storage Temperature −65°C to +150°C Supply Voltage 2.2V to 12V SW Voltage 17.5V (1) All limits specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are 100% tested or ensured through statistical analysis. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). 4 Submit Documentation Feedback Copyright © 2001–2013, Texas Instruments Incorporated Product Folder Links: LM2700 |
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