Data Sheet

6

Rev. 1.2, 2014-07-03

TLE42744

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Notes

1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are not

designed for continuous repetitive operation.

4.2

Functional Range

Table 1

T

1) not subject to production test, specified by design

Parameter

Symbol

Values

Unit

Note / Test Condition

Number

Min.

Typ.

Max.

Input I

Voltage

V

I

-42

–

45

V

–

P_4.1.1

Output Q

Voltage

V

Q

-1

–

40

V

–

P_4.1.2

Temperature

Junction temperature

T

j

-40

–

150

°C

–

P_4.1.3

Storage temperature

T

stg

-50

–

150

°C

–

P_4.1.4

ESD Susceptibility

ESD Absorption

V

ESD,HBM

-4

–

4

kV

Human Body Model

2) ESD susceptibility Human Body Model “HBM” according to AEC-Q100-002 - JESD22-A114

P_4.1.5

ESD Absorption

V

ESD,CDM

-1000

–

1000

V

Charge Device Model

3) ESD susceptibility Charged Device Model “CDM” according to ESDA STM5.3.1

P_4.1.6

Table 2

Functional Range

Parameter

Symbol

Values

Unit Note / Test Condition

Number

Min.

Typ. Max.

Input voltage

V

I

5.5

–

40

V

TLE42744DV50,

TLE42744GV50,

TLE42744EV50

P_4.2.1

Input voltage

V

I

4.7

–

40

V

TLE42744GV33,

TLE42744DV33,

TLE42744GSV33

P_4.2.2