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LC709201F Datasheet(PDF) 5 Page - ON Semiconductor |
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LC709201F Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 10 page LC709201F No.A2031-5/10 Absolute Maximum Ratings at Ta=25°C, VSS=0V Parameter Symbol Pin/Remarks Conditions Specification Unit VDD[V] min typ max Maximum supply voltage VDD max VDD -0.3 +6.5 V Input voltage VI (1) RESB, TSENSE -0.3 VDD +0.3 Output voltage VO (1) TSW -0.3 VDD +0.3 Input/output voltage VIO (1) SDA, SCL, TEST -0.3 VDD +0.3 Allowable power dissipation Pd max MFP10S Ta=-40 to +85 °C 110 mW VCT16 55 Operating ambient temperature Topr -40 +85 °C Storage ambient temperature Tstg -55 -125 Allowable Operating Conditions at Ta=-40 to +85°C, VSS=0V Parameter Symbol Pin/Remarks Conditions Specification unit VDD[V] min typ max Operating supply voltage VDD (1) VDD 2.25 5.5 V High level input voltage VIH (1) SDA, SCL 2.25 to 5.5 0.3VDD +0.7 VDD Low level input voltage VIL (1) SDA, SCL 4.0 to 5.5 VSS 0.1VDD +0.4 VIL (2) 2.25 to 4.0 VSS 0.2VDD Electrical Characteristics at Ta=-40 to +85°C, VSS=0V Parameter Symbol Pin/Remarks Conditions Specification Unit VDD[V] min typ max High level input current IIH (1) RESB, SDA, SCL VIN=VDD (including output transistor off leakage current) 2.25 to 5.5 1 μA Low level input current IIL (1) RESB, SDA, SCL VIN=VSS (including output transistor off leakage current) 2.25 to 5.5 -1 High level output voltage VOH (1) TSW IOH=-0.4mA 3.0 to 5.5 VDD-0.4 V VOH (2) IOH=-0.2mA 2.25 to 5.5 VDD-0.4 Low level output voltage VOL (1) TSW, SDA, SCL IOL=3.0mA 3.0 to 5.5 0.4 VOL (2) IOL=1.3mA 2.25 to 5.5 0.4 Hysteresis voltage VHYS RESB, SDA, SCL 2.25 to 5.5 0.1VDD Pin capacitance CP All pins Pins other than the pin under test VIN=VSS f=1 MHz Ta=25 °C 2.25 to 5.5 10 pF Consumption current IDD (1) VDD When detecting remaining capacity 2.25 to 5.5 8 16 μA IDD (2) When not detecting remaining capacity 2.25 to 5.5 5 12 Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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