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100314 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # 100314
Description  Low Power Quint Differential Line Receiver
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

100314 Datasheet(HTML) 3 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired (Note 1)
Storage Temperature (T
STG)
−65˚C to +150˚C
Maximum Junction Temperture (T
J)
Ceramic
+175˚C
Pin Potential to Ground Pin (V
EE)
−7.0V to +0.5V
Input Voltage (DC)
V
EE to +0.5V
Output Current (DC Output HIGH)
−50 mA
ESD (Note 2)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C)
Military
−55˚C to +125˚C
Supply Voltage (V
EE)
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C (Note 5)
Symbol
Parameter
Min
Typ
Max
Units
TC
Conditions
Notes
VOH
Output HIGH
Voltage
−1025
−870
mV
0˚C to
VIN = VIH (Max)
or VIL (Min)
Loading with
50
Ω to −2.0V
+125˚C
−1085
−870
mV
−55˚C
(Notes 3, 4, 5)
VOL
Output LOW Voltage
−1830
−1620
mV
0˚C to
+125˚C
−1830
−1555
mV
−55˚C
VOHC
Output HIGH
−1035
mV
0˚C to
VIN = VIH (Max)
or VIL (Min)
Loading with
50
Ω to −2.0V
Voltage
+125˚C
−1085
mV
−55˚C
(Notes 3, 4, 5)
VOLC
Output LOW
−1610
mV
0˚C to
Voltage
+125˚C
−1555
mV
−55˚C
VBB
Output Reference
−1260
mV
0˚C to
IVBB = 0 µA, VEE = 4.2V
(Notes 3, 4, 5)
Voltage
+125˚C
−1380
−1260
mV
0˚C to
IVBB = −250 µA, VEE = −5.7V
+125˚C
(Notes 3, 4, 5)
−1396
mV
−55˚C
IVBB = −350 µA, VEE = −5.7V
VDIFF
Input Voltage
150
mV
−55˚C to
Required for Full Output Swing
(Notes 3, 4, 5)
Differential
+125˚C
VCM
Common Mode
VCC − 2.0
VCC − 0.5
V
−55˚C to
(Notes 3, 4, 5)
Voltage
+125˚C
VIH
Single-Ended
−1165
−870
mV
−55˚C to
Guaranteed HIGH Signal for All
(Notes 3, 4, 5, 6)
Input High Voltage
+125˚C
Inputs (with Dn tied to VBB)
VIL
Single-Ended
−1830
−1475
mV
−55˚C to
Guaranteed LOW Signal for All
(Notes 3, 4, 5, 6)
Input Low Voltage
+125˚C
Inputs (with Dn tied to VBB)
IIH
Input HIGH Current
50
µA
0˚C to
VIN = VIH (Max),Da–De = VBB,
+125˚C
Da–De = VIL (Min)
(Notes 3, 4, 5)
70
µA
−55˚C
ICBO
Input Leakage
−10
µA
−55˚C to
VIN = VEE,Da–De = VBB,
(Notes 3, 4, 5)
Current
+125˚C
Da–De = VIL (Min)
IEE
Power Supply
−65
−25
mA
−55˚C to
Da–De = VBB,
(Notes 3, 4, 5)
Current
+125˚C
Da–De = VIL (Min)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
www.national.com
3


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