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LMP8646MKE Datasheet(PDF) 5 Page - Texas Instruments |
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LMP8646MKE Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 31 page  LMP8646 www.ti.com SNOSC63B – FEBRUARY 2012 – REVISED DECEMBER 2014 6.5 Electrical Characteristics: 2.7 V Unless otherwise specified, all limits ensured for at TA = 25°C, VS= (V + – V-) = (2.7 V - 0 V) = 2.7 V, −2 V < V CM < 76 V, RG= 25 k Ω, RL = 10 kΩ. (1) PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT VOFFSET Input Offset Voltage VCM = 2.1 V –1 1 mV VCM = 2.1 V, –40°C ≤ TJ ≤ 125°C –1.7 1.7 TCVOS Input Offset Voltage Drift(4)(5) VCM = 2.1 V 7 μV/°C IB Input Bias Current(6) VCM = 2.1 V 12 20 μA eni Input Voltage Noise(5) f > 10 kHz, RG = 5 kΩ 120 nV/ √Hz VSENSE Max Input Sense Voltage(5) VCM = 12 V, RG = 5 kΩ 600 mV Gain AV Adjustable Gain Setting(5) VCM = 12 V 1 100 V/V Gm Transconductance = 1/RIN VCM = 2.1 V 200 µA/V VCM = 2.1 V –2% 2% Accuracy VCM = 2.1 V, –40°C ≤ TJ ≤ 125°C –3.4% 3.4% Gm drift(5) −40°C to 125°C, VCM= 2.1 V 140 ppm /°C PSRR Power Supply Rejection Ratio VCM = 2.1 V, 2.7 V < V + < 12 V 85 dB CMRR 2.1 V < VCM < 76 V 95 Common-Mode Rejection Ratio dB –2 V <VCM < 2.1 V 55 SR Slew Rate(7)(5) VCM = 5 V, CG = 4 pF, VSENSE from 25 mV 0.5 V/µs to 175 mV, CL = 30 pF, RL = 1MΩ IS Supply Current VCM = 2.1 V 380 610 VCM = 2.1 V, –40°C ≤ TJ ≤ 125°C 807 uA VCM = –2 V 2000 2500 VCM = –2 V, –40°C ≤ TJ ≤ 125°C 2700 VOUT Maximum Output Voltage VCM = 2.1 V, RG = 500 kΩ 1.1 V Minimum Output Voltage VCM = 2.1 V 20 mV Maximum Output Voltage VS = VCM = 3.3 V, RG = 500 kΩ 1.6 V Minimum Output Voltage VS = VCM = 3.3 V, RG = 500 kΩ 22 mV IOUT Output current(5) Sourcing, VOUT= 600 mV, RG = 150 kΩ 5 mA CLOAD Max Output Capacitance Load(5) 30 pF (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No assurance of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) All limits are specified by testing, design, or statistical analysis. (3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material. (4) Offset voltage temperature drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change. (5) This parameter is specified by design and/or characterization and is not tested in production. (6) Positive Bias Current corresponds to current flowing into the device. (7) The number specified is the average of rising and falling slew rates and measured at 90% to 10%. Copyright © 2012–2014, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LMP8646 |
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