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STB37N60DM2AG Datasheet(PDF) 5 Page - STMicroelectronics

Part # STB37N60DM2AG
Description  Extremely low gate charge and input capacitance
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STB37N60DM2AG Datasheet(HTML) 5 Page - STMicroelectronics

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STB37N60DM2AG
Electrical characteristics
DocID028271 Rev 1
5/15
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
28
A
ISDM(1)
Source-drain current
(pulsed)
-
112
A
VSD(2)
Forward on voltage
VGS = 0 V, ISD = 28 A
-
1.6
V
trr
Reverse recovery
time
ISD = 28 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16: "Test
circuit for inductive load
switching and diode recovery
times")
-
120
ns
Qrr
Reverse recovery
charge
-
572
nC
IRRM
Reverse recovery
current
-
10.2
A
trr
Reverse recovery
time
ISD = 28 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
215
ns
Qrr
Reverse recovery
charge
-
1.89
µC
IRRM
Reverse recovery
current
-
17.7
A
Notes:
(1) Pulse width is limited by safe operating area.
(2) Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
Table 9: Gate-source Zener diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
V(BR)GSO
Gate-source breakdown voltage
IGS = ±250 µA, ID = 0 A
±30
-
-
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.


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