SN65HVD265, SN65HVD266, SN65HVD267

SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015

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7 Specifications

7.1 Absolute Maximum Ratings

Over operating free-air temperature range (unless otherwise noted).

(1) (2)

MIN

MAX

UNIT

Supply voltage

–0.3

6

V

RXD Output supply voltage

SN65HVD266

–0.3

V

CAN Bus I/O voltage (CANH, CANL)

–27

40

V

Logic input terminal voltage (TXD, S)

–0.3

6

V

SN65HVD265,

–0.3

6

V

SN65HVD267

Logic output terminal voltage (RXD)

SN65HVD266

–0.3

V

RXD (Receiver) output current

12

mA

FAULT output current

SN65HVD267

20

mA

Operating virtual junction temperature (see Thermal Information)

–40

150

°C

Ambient temperature (see Thermal Information)

–40

125

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values, except differential I/O bus voltages, are with respect to ground terminal.

7.2 ESD Ratings: AEC

VALUE

UNIT

Human body model (HBM), per

All pins

±2500

±12000

Electrostatic

V

discharge

±750

Machine Model

±250

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

Test method based upon JEDEC Standard 22 Test Method A114, CAN bus stressed with respect to GND.

(3)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 ESD Ratings: IEC

VALUE

UNIT

Electrostatic

±8000

V

discharge

(1)

IEC 61400-4-2 is a system level ESD test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions.

Different system level configurations may lead to different results.

7.4 Transient Protection

VALUE

UNIT

Pulse 1

–100

V

Pulse 2

+75

V

CAN bus pins

(CANH, CANL)

Pulse 3a

–150

V

Pulse 3b

+100

V

(1)

ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions.

Different system level configurations may lead to different results.

4

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