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SN74LVCH8T245

SCES637B – AUGUST 2005 – REVISED FEBRUARY 2016

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(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

The output positive-voltage rating may be exceeded up to 6.5 V maximum if the output current rating is observed.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

–0.5

6.5

V

I/O ports (A port)

–0.5

6.5

V

I/O ports (B port)

–0.5

6.5

Control inputs

–0.5

6.5

Voltage range applied to any output

A port

–0.5

6.5

V

B port

–0.5

6.5

A port

–0.5

V

B port

–0.5

Input clamp current

–50

mA

Output clamp current

–50

mA

±50

mA

Continuous through current

±100

mA

–40

150

°C

–65

150

°C

(1)

JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic discharge

±4000

V

±1000

Machine model (MM)

±200

(1)

(2)

(3)

consumption. See Implications of Slow or Floating CMOS Inputs, SCBA004.

(4)

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1) (2) (3)

MIN

MAX

UNIT

Supply voltage

1.65

5.5

V

1.65

5.5

V

1.7

2

V

0.7

0.8