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ADIS16488A Datasheet(PDF) 4 Page - Analog Devices

Part # ADIS16488A
Description  Tactical Grade, Ten Degrees of Freedom Inertial Sensor
Download  35 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADIS16488A Datasheet(HTML) 4 Page - Analog Devices

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ADIS16488A
Data Sheet
Rev. C | Page 4 of 35
Parameter
Test Conditions/Comments
Min
Typ
Max
Unit
Sensitivity
BAROM_OUT and BAROM_LOW (32-bit)
6.1 × 10−7
mbar/LSB
Error with Supply
0.04
%/V
Total Error
4.5
mbar
Relative Error 3
−40°C ≤ TC ≤ +85°C
2.5
mbar
Nonlinearity4
Best fit straight line, FS = 1100 mbar
0.1
% of FS
−40°C ≤ TC ≤ +85°C
0.2
% of FS
Linear-g Sensitivity
±1 g, 1 σ
0.005
mbar/g
Noise
0.025
mbar rms
TEMPERATURE SENSOR
Scale Factor
Output = 0x0000 at 25°C (±5°C)
0.00565
°C/LSB
LOGIC INPUTS5
Input High Voltage, VIH
2.0
V
Input Low Voltage, VIL
0.8
V
CS Wake-Up Pulse Width
20
µs
Logic 1 Input Current, IIH
VIH = 3.3 V
10
µA
Logic 0 Input Current, IIL
VIL = 0 V
All Pins Except RST
10
µA
RST Pin
0.33
mA
Input Capacitance, CIN
10
pF
DIGITAL OUTPUTS
Output High Voltage, VOH
ISOURCE = 0.5 mA
2.4
V
Output Low Voltage, VOL
ISINK = 2.0 mA
0.4
V
FLASH MEMORY
Endurance 6
100,000
Cycles
Data Retention7
TJ = 85°C
20
Years
FUNCTIONAL TIMES8
Time until data is available
Power-On Start-Up Time
500
ms
Reset Recovery Time 9
500
ms
Sleep Mode Recovery Time
500
µs
Flash Memory
Update Time
375
ms
Test Time
50
ms
Automatic Self Test Time
Using internal clock, 100 SPS
12
ms
CONVERSION RATE
2.46
kSPS
Initial Clock Accuracy
0.02
%
Temperature Coefficient
40
ppm/°C
Sync Input Clock
0.7 10
2.4
kHz
POWER SUPPLY, VDD
Operating voltage range
3.0
3.6
V
Power Supply Current 11
Normal mode, VDD = 3.3 V, µ ± σ
245
mA
Sleep mode, VDD = 3.3 V
12.2
mA
Power-down mode, VDD = 3.3 V
45
µA
POWER SUPPLY, VDDRTC
Operating voltage range
3.0
3.6
V
Real-Time Clock Supply Current
Normal mode, VDDRTC = 3.3 V
13
µA
1
The repeatability specifications represent analytical projections based on the following drift contributions and conditions: temperaturehysteresis (−40°C to +85°C), electronics
drift (high temperature operating life test: +110°C,500 hours), drift from temperature cycling (JESD22, Method A104-C,Method N, 500 cycles, −55°C to +85°C), raterandom walk
(10-year projection),and broadband noise.
2
Bias repeatability describesa long-term behavior over a variety of conditions. Short-term repeatability relates to the in-run bias stability and noise density specifications.
3
The relative error assumes that the initial error, at 25°C, is corrected in the end application.
4
Specification assumes a full scale (FS) of 1000 mbar.
5
The digital input/output signals use a 3.3 V system.
6
Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C.
7
The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ.
8
These times do not includethermal settling and internal filter responsetimes, which may affect overall accuracy.
9
The RST line must be in a low state for at least 10 μs to assure a proper reset initiation and recovery.
10
Device functionsat clock rates below 0.7kHz, butat reduced performance levels.
11
Supply current transients can reach 600 mA during initial start up or reset recovery.


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