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ADIS16488A Datasheet(PDF) 30 Page - Analog Devices

Part # ADIS16488A
Description  Tactical Grade, Ten Degrees of Freedom Inertial Sensor
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADIS16488A Datasheet(HTML) 30 Page - Analog Devices

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ADIS16488A
Data Sheet
Rev. C | Page 30 of 35
SYSTEM CONTROLS
The ADIS16488A provides a number of system level controls for
managing its operation, which include reset, self test, calibration,
memory management, and input/output configuration.
GLOBAL COMMANDS
The GLOB_CMD register (see Table 115) provides trigger bits for
several operations. Write 1 to the appropriate bit in GLOB_CMD to
start a function. After the function completes, the bit restores to 0.
Table 115. GLOB_CMD (Page 3, Base Address = 0x02)
Bits
Description
Execution Time
[15:8]
Not used
Not applicable
7
Software reset
120 ms
6
Factory calibration restore
75 ms
[5:4]
Not used
Not applicable
3
Flash memory update
375 ms
2
Flash memory test
50 ms
1
Self test
12 ms
0
Bias null
See Table 71
Software Reset
Turn to Page 3 (DIN = 0x8003) and then set GLOB_CMD[7] = 1
(DIN = 0x8280, DIN = 0x8300) to reset the operation, which
removes all data, initializes all registers from their flash settings,
and starts data collection. This function provides a firmware
alternative to the RST pin (see Table 6, Pin 8).
Automatic Self-Test
Turn to Page 3 (DIN = 0x8003) and then set GLOB_CMD[1] = 1
(DIN = 0x8202, then DIN = 0x8300) to run an automatic self
test routine, which executes the following steps:
1.
Measure the output on each sensor.
2.
Activate the self test on each sensor.
3.
Measure the output on each sensor.
4.
Deactivate the self test on each sensor.
5.
Calculate the difference with self test on and off.
6.
Compare the difference with internal pass/fail criteria.
7.
Report the pass/fail results for each sensor in DIAG_STS.
After waiting 12 ms for this test to complete, turn to Page 0
(DIN = 0x8000) and read DIAG_STS using DIN = 0x0A00.
Using an external clock can extend this time. When using an
external clock of 100 Hz, this time extends to 35 ms. Note that
100 Hz is too slow for optimal sensor performance.
MEMORY MANAGEMENT
The data retention of the flash memory depends on temperature
and the number of write cycles. Figure 25 characterizes the
dependence on temperature, and the FLSHCNT_LOW and
FLSHCNT_HIGH registers (see Table 116 and Table 117)
provide a running count of flash write cycles. The flash updates
every time GLOB_CMD[6], GLOB_CMD[3], or GLOB_CMD[0]
is set to 1.
Table 116. FLSHCNT_LOW (Page 2, Base Address = 0x7C)
Bits
Description
[15:0]
Binary counter; number of flash updates, lower word
Table 117. FLSHCNT_HIGH (Page 2, Base Address = 0x7E)
Bits
Description
[15:0]
Binary counter; number of flash updates, upper word
600
450
300
150
0
30
40
JUNCTION TEMPERATURE (°C)
55
70
85
100
125
135
150
Figure 25. Flash Memory Retention
Flash Memory Test
Turn to Page 3 (DIN = 0x8003), and then set GLOB_CMD[2] = 1
(DIN = 0x8204, DIN = 0x8300) to run a checksum test of the
internal flash memory, which compares a factory programmed
value with the current sum of the same memory locations. The
result of this test loads into SYS_E_FLAG[6]. Turn to Page 0
(DIN = 0x8000) and use DIN = 0x0800 to read SYS_E_FLAG.
GENERAL-PURPOSE INPUT/OUTPUT
There are four general-purpose input/output pins: DIO1, DIO2,
DIO3, and DIO4. The FNCTIO_CTRL register controls the basic
function of each input/output pin, which provides a number of
useful functions. Each input/output pin only supports one function
at a time. In cases where a single pin has two different assignments,
the enable bit for the lower priority function automatically resets to
zero and is disabled. The priority is (1) data ready, (2) sync clock
input, (3) alarm indicator, and (4) general purpose, where 1
identifies the highest priority and 4 indicates the lowest priority.


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