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ABSOLUTE MAXIMUM RATINGS

TPS79301, TPS79318

TPS79325, TPS79328, TPS793285

TPS79330, TPS79333, TPS793475

SLVS348H – JULY 2001 – REVISED OCTOBER 2004

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

PRODUCT

VOLTAGE

PACKAGE

SYMBOL

PART NUMBER

TPS79301

1.22 V to 5.5 V

SOT23 (DBV)

PGVI

TPS79301DBVR

SOT23 (DBV)

PHHI

TPS79318DBVR

TPS79318

1.8 V

CSP (YEQ)

E3

TPS79318YEQ

SOT23 (DBV)

PGWI

TPS79325DBVR

TPS79325

2.5 V

CSP (YEQ)

E4

TPS79325YEQ

SOT23 (DBV)

PGXI

TPS79328DBVR

TPS79328

2.8 V

CSP (YEQ)

-40

°C to +125°C

E2

TPS79328YEQ

SOT23 (DBV)

PHII

TPS793285DBVR

TPS793285

2.85 V

CSP (YEQ)

E5

TPS793285YEQ

SOT23 (DBV)

PGYI

TPS79330DBVR

TPS79330

3 V

CSP (YEQ)

E6

TPS79330YEQ

TPS79333

3.3 V

SOT23 (DBV)

PHUI

TPS79333DBVR

TPS793475

4.75 V

SOT23 (DBV)

PHJI

TPS793475DBVR

(1)

For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.

(2)

DBVR indicates tape and reel of 3000 parts. YEQR indicates tape and reel of 3000 parts. YEQT indicates tape and reel of 250 parts.

UNIT

-0.3 V to 6 V

-0.3 V to 6 V

Peak output current

Internally limited

ESD rating, HBM

2 kV

ESD rating, CDM

500 V

Continuous total power dissipation

See Dissipation Ratings Table

Junction temperature range, DBV package

-40

°C to 150°C

Junction temperature range, YEQ package

-40

°C to 125°C

-65

°C to 150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2