IS62C256

4

Integrated Silicon Solution, Inc. — 1-800-379-4774

SR072-1E

05/12/99

DATA RETENTION CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min.

Max.

Units

2.0

—

V

Data retention current

°C to +25°C

—

200

µA

Data retention current

°C to +70°C

—

200

µA

Figure 1.

Figure 2.

480

Ω

100 pF

Including

jig and

scope

255

Ω

OUTPUT

5V

480

Ω

5 pF

Including

jig and

scope

255

Ω

OUTPUT

5V

AC TEST LOADS

AC TEST CONDITIONS

Parameter

Unit

Input Pulse Level

0V to 3.0V

Input Rise and Fall Times

3 ns

Input and Output Timing

1.5V

and Reference Levels

Output Load

See Figures 1 and 2

-45 ns

-70 ns

Symbol

Parameter

Min.

Max.

Min.

Max.

Unit

Read Cycle Time

45

—

70

—

ns

Address Access Time

—

45

—

70

ns

Output Hold Time

2

—

2

—

ns

CS Access Time

—

45

—

70

ns

OE Access Time

—

25

—

35

ns

OE to Low-Z Output

0

—

0

—

ns

OE to High-Z Output

0

20

0

25

ns

CS to Low-Z Output

3

—

3

—

ns

CS to High-Z Output

0

20

0

25

ns

CS to Power-Up

0

—

0

—

ns

CS to Power-Down

—

30

—

50

ns

Notes:

1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and

output loading specified in Figure 1.

2. Tested with the load in Figure 2. Transition is measured

±500 mV from steady-state voltage. Not 100% tested.

3. Not 100% tested.