CY74FCT16952T

CY74FCT162952T

CY74FCT162H952T

3

Note:

7.

8.

This parameter is specified but not tested.

9.

Pins with bus hold are described in the Pin Description.

10. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a

high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests,

11. Tested at +25˚C.

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

–0.7

–1.2

V

Input HIGH Current

Standard

±1

µA

Bus Hold

±100

Input LOW Current

Standard

±1

µA

Bus Hold

±100

µA

–50

µA

+50

µA

TBD

mA

High Impedance Output Current (Three-State

Output pins)

±1

µA

High Impedance Output Current (Three-State

Output pins)

±1

µA

–80

–140

–200

mA

–50

–180

mA

Power-Off Disable

[11]

±1

µA

Output Drive Characteristics for CY74FCT16952T

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

2.5

3.5

V

2.4

3.5

V

2.0

3.0

V

Output LOW Voltage

0.2

0.55

V

Output Drive Characteristics for CY74FCT162952T, CY74FCT162H952T

Parameter

Description

Test Conditions

Min.

Max.

Unit

60

115

150

mA

–60

–115

–150

mA

Output HIGH Voltage

2.4

3.3

V

Output LOW Voltage

0.3

0.55

V

Parameter

Description

Test Conditions

Max.

Unit

Input Capacitance

4.5

6.0

pF

Output Capacitance

5.5

8.0

pF