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CD74AC32M Datasheet(PDF) 1 Page - Texas Instruments |
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CD74AC32M Datasheet(HTML) 1 Page - Texas Instruments |
1 / 14 page CD54AC32, CD74AC32 QUADRUPLE 2-INPUT POSITIVE-OR GATES SCHS343 – MARCH 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D AC Types Feature 1.5-V to 5.5-V Operation and Balanced Noise Immunity at 30% of the Supply D Buffered Inputs D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 description/ordering information The ’AC32 devices are quadruple 2-input positive-OR gates. These devices perform the Boolean function Y + A • B or Y + A ) B in positive logic. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube CD74AC32E CD74AC32E 55 °Cto125°C SOIC M Tube CD74AC32M AC32M –55 °C to 125°C SOIC – M Tape and reel CD74AC32M96 AC32M CDIP – F Tube CD54AC32F3A CD54AC32F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS OUTPUT A B Y H X H X HH L L L Copyright 2003, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1B 1Y 2A 2B 2Y GND VCC 4B 4A 4Y 3B 3A 3Y CD54AC32 ...F PACKAGE CD74AC32 ...E OR M PACKAGE (TOP VIEW) On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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