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SN74BCT757DWE4 Datasheet(PDF) 2 Page - Texas Instruments |
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SN74BCT757DWE4 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 11 page  SN74BCT757 OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS SCBS041D − NOVEMBER 1989 − REVISED NOVEMBER 1993 2−2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 logic symbol† logic diagram (positive logic) † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. 2 1A1 4 1A2 6 1A3 8 1A4 EN 1 1Y1 18 1Y2 16 1Y3 14 1Y4 12 11 2A1 13 2A2 15 2A3 17 2A4 EN 19 2OE 2Y1 9 2Y2 7 2Y3 5 2Y4 3 1OE 1 2 4 6 8 19 11 13 15 17 3 5 7 9 12 14 16 18 1A1 1A2 1A3 1A4 1Y1 2OE 2A1 2A2 2A3 2A4 2Y1 1Y2 1Y3 1Y4 2Y2 2Y3 2Y4 1OE absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage range, VCC −0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range, VI −0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input current range, II −30 mA to 5 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage range applied to any output in the disabled or power-off state, VO −0.5 V to 5.5 V . . . . . . . . . . . . . . . Voltage range applied to any output in the high state, VO −0.5 V to VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Current into any output in the low state, IO 128 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range 0 °C to 70°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range −65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. |
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