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SN74LVC1G27YZPR Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVC1G27YZPR Datasheet(HTML) 1 Page - Texas Instruments |
1 / 24 page See mechanical drawings for dimensions. DBV PACKAGE (TOP VIEW) 2 GND V CC 5 3 4 B Y 6 1 A C DCK PACKAGE (TOP VIEW) 3 4 B 2 GND Y 5 1 A V CC 6 C DRY PACKAGE (TOP VIEW) GND V CC A 6 5 4 2 3 B Y C 1 YZP PACKAGE (BOTTOM VIEW) GND V CC A B 2 1 3 Y 5 4 6 C A B DSF PACKAGE (TOP VIEW) GND C Y V CC 6 5 4 2 3 1 SN74LVC1G27 www.ti.com SCES488E – SEPTEMBER 2003 – REVISED DECEMBER 2013 Single 3-Input Positive-NOR Gate Check for Samples: SN74LVC1G27 1 FEATURES DESCRIPTION The SN74LVC1G27 device performs the Boolean 2 • Available in the Texas Instruments NanoFree™ function Y = A + B + C or Y = A • B • C in positive Package logic. • Supports 5-V VCC Operation NanoFree™ package technology is a major • Inputs Accept Voltages to 5.5 V breakthrough in IC packaging concepts, using the die • Supports Down Translation to VCC as the package. • Max tpd of 4.5 ns at 3.3 V This device is fully specified for partial-power-down • Low Power Consumption, 10-µA Max ICC applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow • ±24-mA Output Drive at 3.3 V through the device when it is powered down. • Ioff Supports Live Insertion, Partial-Power- Down Mode, and Back-Drive Protection • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 NanoFree is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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