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SN75LVDS82DGGR Datasheet(PDF) 7 Page - Texas Instruments |
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SN75LVDS82DGGR Datasheet(HTML) 7 Page - Texas Instruments |
7 / 20 page tc NOTE A: The worst-case test pattern produces the maximum switching frequency for all of the outputs. CLKOUT EVEN Dn ODD Dn Dn tsu2 CLKOUT th2 70% VOH 70% VOH 30% VOH 30% VOH SN75LVDS82 www.ti.com SLLS259I – NOVEMBER 1996 – REVISED APRIL 2011 PARAMETER MEASUREMENT INFORMATION (continued) Figure 5. Worst-Case Test-Pattern Waveforms Figure 6. Setup and Hold Time Waveforms Copyright © 1996–2011, Texas Instruments Incorporated 7 |
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