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AN-7500 Datasheet(PDF) 3 Page - Fairchild Semiconductor |
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AN-7500 Datasheet(HTML) 3 Page - Fairchild Semiconductor |
3 / 5 page ©2002 Fairchild Semiconductor Corporation Application Note 7500 Rev. A1 Because of the character of its silicon structure, a MOSFET has a positive temperature coefficient of resistance, as shown by the curves of Figure 4. The positive temperature coefficient of resistance means that a MOSFET is inherently more stable with temperature fluctuation, and provides its own protection against thermal runaway and second breakdown. Another benefit of this characteristic is that MOSFETs can be operated in parallel without fear that one device will rob current from the others. If any device begins to overheat, its resistance will increase, and its current will be directed away to cooler chips. Gate Parameters To permit the flow of drain-to-source current in an n-type MOSFET, a positive voltage must be applied between the gate and source terminals. Since, as described above, the gate is electrically isolated from the body of the device, theoretically no current can flow from the driving source into the gate. In reality, however, a very small current, in the range of tens of nanoamperes, does flow, and is identified on data sheets as a leakage current, IGSS. Because the gate current is so small, the input impedance of a MOSFET is extremely high (in the megohm range) and, in fact, is largely capacitive rather than resistive (because of the isolation of the gate terminal). Figure 5 illustrates the basic input circuit of a MOSFET. The ele- ments are equivalent, rather than physical, resistance, R, and capacitance, C. The capacitance, called CISS on MOSFET data sheets, is a combination of the device's internal gate-to- source and gate-to-drain capacitance. The resistance, R, repre- sents the resistance of the material in the gate circuit. Together, the equivalent R and C of the input circuit will determine the upper frequency limit of MOSFET operation. Operating Frequency Most DMOS processes use a polysilicon gate structure rather than the metal-gate type. If the resistance of the gate structure (R in Figure 5) is high, the switching time of the DMOS device is increased, thereby reducing its upper oper- ating frequency. Compared to a metal gate, a polysilicon gate has a higher gate resistance. This property accounts for the frequent use of metal-gate MOSFETs in high-frequency (greater than 20MHz) applications, and polysilicon-gate MOSFETs in higher-power but lower-frequency systems. Since the frequency response of a MOSFET is controlled by the effective R and C of its gate terminal, a rough estimate can be made of the upper operating frequency from datasheet parameters. The resistive portion depends on the sheet resistance of the polysilicon-gate overlay structure, a value of approximately 20 ohms. But whereas the total R value is not found on datasheets, the C value (CISS) is; it is recorded as both a maximum value and in graphical form as a function of drain-to-source voltage. The value of CISS is closely related to chip size; the larger the chip, the greater the value. Since the RC combination of the input circuit must be charged and discharged by the driving circuit, and since the capacitance dominates, larger chips will have slower switching times than smaller chips, and are, therefore, more useful in lower-frequency circuits. In general, the upper frequency limit of most power MOSFETs spans a fairly broad range, from 1MHz to 10MHz. 0 100 200 300 400 500 600 BVDSS (V) 10 6 4 2 1 0.6 0.4 0.2 0.1 0.06 0.04 0.02 0.01 CHIP CHIP LARGEST SMALLEST FIGURE 3. AS CHIP SIZE INCREASES, rDS(ON) DECREASES ID = 4A VGS = 10V 4 3 2 1 0 -50 0 50 100 150 200 JUNCTION TEMPERATURE - TJ ( oC) FIGURE 4. MOSFETs HAVE A POSITIVE TEMPERATURE COEFFICIENT OF RESISTANCE, WHICH GREATLY REDUCES THE POSSIBILITY OF THERMAL RUNAWAY AS TEMPERATURE INCREASES G S D CISS R FIGURE 5. A MOSFETs SWITCHING SPEED IS DETERMINED BY ITS INPUT RESISTANCE R AND ITS INPUT CAPACITANCE CISS Application Note 7500 |
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