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TLV5606CD Datasheet(PDF) 4 Page - Texas Instruments |
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TLV5606CD Datasheet(HTML) 4 Page - Texas Instruments |
4 / 28 page TLV5606 2.7V TO 5.5V LOW POWER 10BIT DIGITALTOANALOG CONVERTERS WITH POWER DOWN SLAS259B − DECEMBER 1999 − REVISED APRIL 2004 4 WWW.TI.COM electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) (continued) static DAC specifications RL = 10 kΩ, CL = 100 pF PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Resolution 10 10 bits INL Integral nonlinearity See Note 4 ± 0.5 ±1.5 LSB DNL Differential nonlinearity See Note 5 ± 0.2 ± 1 LSB EZS Zero-scale error (offset error at zero scale) See Note 6 ±10 mV Zero-scale-error temperature coefficient See Note 7 10 ppm/ °C EG Gain error See Note 8 ±0.6 % of FS voltage Gain-error temperature coefficient See Note 9 10 ppm/ °C NOTES: 4. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale errors. Tested from code 10 to code 1023. 5. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code. Tested from code 10 to code 1023. 6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero. 7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) − EZS (Tmin)]/Vref × 106/(Tmax − Tmin). 8. Gain error is the deviation from the ideal output (2Vref − 1 LSB) with an output load of 10 kΩ excluding the effects of the zero-error. 9. Gain temperature coefficient is given by: EG TC = [EG(Tmax) − EG (Tmin)]/Vref × 106/(Tmax − Tmin). output specifications PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VO Voltage output range RL = 10 kΩ 0 AVDD−0.1 V Output load regulation accuracy RL = 2 kΩ, vs 10 kΩ 0.1 ±0.25 % of FS voltage reference input (REF) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VI Input voltage range 0 VDD−1.5 V RI Input resistance 10 M Ω CI Input capacitance 5 pF Reference input bandwidth REFIN = 0.2 Vpp + 1.024 V dc Slow 525 kHz Reference input bandwidth REFIN = 0.2 Vpp + 1.024 V dc Fast 1.3 MHz Reference feed through REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10) −75 dB NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000. digital inputs PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IIH High-level digital input current VI = VDD ±1 µA IIL Low-level digital input current VI = 0 V ±1 µA CI Input capacitance 3 pF |
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