MAX3222

3V TO 5.5V MULTICHANNEL RS232 LINE DRIVER/RECEIVER

WITH ±15kV ESD PROTECTION

SLLS408G − JANUARY 2000 − REVISED MARCH 2004

4

POST OFFICE BOX 655303

DRIVER SECTION

electrical characteristics over recommended ranges of supply voltage and operating free-air

temperature (unless otherwise noted) (see Note 4 and Figure 5)

PARAMETER

TEST CONDITIONS

MIN

TYP†

MAX

UNIT

VOH

High-level output voltage

DOUT at RL = 3 kΩ to GND,

DIN = GND

5

5.4

V

VOL

Low-level output voltage

DOUT at RL = 3 kΩ to GND,

DIN = VCC

−5

−5.4

V

IIH

High-level input current

VI = VCC

±0.01

±1

µA

IIL

Low-level input current

VI at GND

±0.01

±1

µA

VCC = 3.6 V,

VO = 0 V

IOS

Short-circuit output current‡

VCC = 3.6 V,

VO = 0 V

±35

±60

mA

IOS

Short-circuit output current‡

VCC = 5.5 V,

VO = 0 V

±35

±60

mA

ro

Output resistance

VCC, V+, and V− = 0 V,

VO = ±2 V

300

10M

Ω

Ioff

Output leakage current

PWRDOWN = GND,

VCC = 3 V to 3.6 V

VO = ±12 V,

±25

µA

Ioff

Output leakage current

PWRDOWN = GND,

VCC = 4.5 V to 5.5 V

VO = ±10 V,

±25

µA

† All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

‡ Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one output

should be shorted at a time.

NOTE 4: Test conditions are C1−C4 = 0.1

µF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2−C4 = 0.33 µF at VCC = 5 V ± 0.5 V.

switching characteristics over recommended ranges of supply voltage and operating free-air

temperature (unless otherwise noted) (see Note 4 and Figure 5)

PARAMETER

TEST CONDITIONS

MIN

TYP†

MAX

UNIT

Maximum data rate

CL = 1000 pF,

RL = 3 kΩ,

150

250

kbit/s

Maximum data rate

CL = 1000 pF,

One DOUT switching,

RL = 3 kΩ,

See Figure 1

150

250

kbit/s

tsk(p)

Pulse skew§

CL = 150 pF to 2500 pF,

See Figure 2

RL = 3 kΩ to 7 kΩ,

300

ns

SR(tr)

Slew rate, transition region

RL = 3 kΩ to 7 kΩ,

CL = 150 pF to 1000 pF

6

30

V/

µs

SR(tr)

Slew rate, transition region

(See Figure 1)

RL = 3 kΩ to 7 kΩ,

VCC = 3.3 V

CL = 150 pF to 2500 pF

4

30

V/

µs

† All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

§ Pulse skew is defined as |tPLH − tPHL| of each channel of the same device.

NOTE 4: Test conditions are C1−C4 = 0.1

µF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2−C4 = 0.33 µF at VCC = 5 V ± 0.5 V.