A1365LKTTN-2-T datasheet(8/32 Pages) ALLEGRO

Part #	A1365LKTTN-2-T

Description	Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC

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Manufacturer	ALLEGRO [Allegro MicroSystems]

Direct Link	http://www.allegromicro.com

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Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC

With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator

A1365

8

Allegro MicroSystems, LLC

115 Northeast Cutoff

Worcester, Massachusetts 01615-0036 U.S.A.

1.508.853.5000; www.allegromicro.com

Characteristic

Symbol

Test Conditions

Min.

Typ.

Max.

Unit1

Factory-Programmed Quiescent Voltage Output Temperature Coefficient

Quiescent Voltage Output

Temperature Coefficient2

TCQVO

TA = 150°C, TA = –40°C, calculated relative

to 25°C

–

0

–

mV/°C

Quiescent Voltage Output Drift

Through Temperature Range2,12,18

ΔVOUT(Q)TC

SENS_COARSE = 00, SENS_COARSE = 01,

or SENS_COARSE = 10, TA = 25°C to 150°C

–10

–

10

mV

SENS_COARSE = 11, TA = 25°C to 150°C

–15

–

15

mV

TA = –40°C to 25°C

–30

–

30

mV

Average Quiescent Voltage

Output Temperature Compensation

Step Size

StepQVOTC

–

2.3

–

mV

Lock Bit Programming

EEPROM Lock Bit

EELOCK

–

1

–

bit

Error Components

Linearity Sensitivity Error2,19

LinERR

–1

< ±0.25

1

%

Symmetry Sensitivity Error2

SymERR

–0.5

< ±0.25

0.5

%

Ratiometry Quiescent Voltage Output

Error2,20

RatERRVOUT(Q) Relative to VCC = 5 V ±5%

–0.3

0

0.3

%

Ratiometry Sensitivity Error2,20

RatERRSens Relative to VCC = 5 V ±5%

–1

< ±0.5

1

%

Ratiometry Clamp Error2,21

RatERRCLP TA = 25ºC, Relative to VCC = 5 V ±5%

–

< ±1

–

%

Sensitivity Drift Due to Package

Hysteresis2

ΔSensPKG

TA = 25°C, after temperature cycling, 25°C to

150°C and back to 25°C

–

-1.25

±1.25

–

%

Sensitivity Drift Over Lifetime22

ΔSensLIFE

TA = 25°C, shift after AEC Q100 grade 0

qualification testing

–

±1%

–

%

1

1 G (gauss) = 0.1 mT (millitesla).

2

See Characteristic Definitions section.

3

fC varies up to approximately ±5% over the full operating ambient temperature range, TA.

4

If the programmed Fault Switchpoint exceeds the clamp voltage, Fault operation will have priority over clamp operation.

5

Sens, VOUT(Q), VCLP(LOW), and VCLP(HIGH) scale with VCC due to ratiometry.

6

Noise, measured in mVPP and in mVRMS, is dependent on the sensitivity of the device.

7

Output stability is maintained for capacitive loads as large as 10 nF.

8

High-to-low transition of output voltage is a function of external load components and device sensitivity.

9

Fault Switchpoint and Fault Hysteresis are ratiometric.

10

Refer to Fault Characteristics section for the impact of load circuit and different Fault switchpoint settings on Transient Fault

Response Time.

11

Raw device characteristic values before any programming.

12

Exceeding the specified ranges will cause sensitivity and Quiescent Voltage Output drift through the temperature range to deteriorate beyond the specified values.

13

Refer to Functional Description section.

14

Step size is larger than required, in order to provide for manufacturing spread. See Characteristic Definitions section.

15

Non-ideal behavior in the programming DAC can cause the step size at each significant bit rollover code to be greater than twice the maximum specified value of

StepVOUT(Q) or StepSENS.

16

Overall programming value accuracy. See Characteristic Definitions section.

17

Each A1365 part number is factory-programmed and temperature compensated at a different coarse sensitivity setting. Changing coarse bits setting could cause sensitiv-

ity drift through temperature range ,ΔSensTC, to exceed specified limits.

18

Allegro will be testing and temperature compensating each device at 150°C. Allegro will not be testing devices at –40°C. Temperature compensation codes will be applied

based on characterization data.

19

Linearity applies to output voltage ranges of ±2 V from the quiescent output for bidirectional devices.

20

Percent change from actual value at VCC = 5 V, for a given temperature, through the supply voltage operating range.

21

Percent change from actual value at VCC = 5 V, TA = 25°C, through the supply voltage operating range.

22

Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits. Cannot be guaranteed. Drift is a function of customer ap-

plication conditions. Contact Allegro MicroSystems for further information.

23

Includes sensitivity drift due to package hysteresis after exposing the sensor to a temperature of 150ºC for 60 seconds during test.

OPERATING CHARACTERISTICS (continued): valid through the full operating temperature range, TA, CBYPASS = 0.1 µF,

and VCC = 5 V, unless otherwise specified

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