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A1366LKTTN-2-T Datasheet(PDF) 8 Page - Allegro MicroSystems |
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A1366LKTTN-2-T Datasheet(HTML) 8 Page - Allegro MicroSystems |
8 / 22 page Low Noise, High Precision, Factory-Programmed Linear Hall Effect Sensor IC with Advanced Temperature Compensation And High Bandwidth (120 kHz) Analog Output A1366 8 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com A1366LKT-2-T PERFORMANCE CHARACTERISTICS1: TA = –40°C to 150°C, CBYPASS = 0.1 µF, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. Max. Unit2 Sensitivity3 SensTA Measured using 400 G, TA = 25°C 2.437 2.5 2.563 mV/G Sensitivity Drift through Temperature Range ΔSensTC TA = 25°C to 150°C -2.5 0 2.5 % TA = -40°C to 25°C -2.5 0 2.5 % Sensitivity Drift Due to Package Hysteresis ∆SensPKG TA = 25°C, after temperature cycling, 25°C to 150°C and back to 25°C – ±1.25 – % Sensitivity Drift Over Lifetime4 ∆SensLIFE TA = –40°C to 150°C, shift after AEC Q100 grade 0 qualification testing – ±1 – % Noise VN TA = 25°C, CL = 1 nF – 7.875 – mVP-P TA = 25°C, CL = 1 nF – 1.25 – mVRMS Quiescent Output Voltage5 VOUT(Q)TA TA = 25°C 2.490 2.500 2.510 V VOUT(Q)HT TA = 25°C to 150°C 2.490 2.500 2.510 V VOUT(Q)LT TA = –40°C to 25°C 2.490 2.500 2.510 V Quiescent Output Voltage Drift Over Lifetime4 ∆VOUT(Q)LIFE TA = –40°C to 150°C, shift after AEC Q100 grade 0 qualification testing – ±2 – mV 1 See Characteristic Performance Data section for parameter distributions across temperature range. 2 1 G (gauss) = 0.1 mT (millitesla). 3 This parameter may drift a maximum of ΔSensLIFE over lifetime. 4 Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 5 This parameter may drift a maximum of ΔVOUT(Q)LIFE over lifetime. |
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