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IDT71T75602S100BG Datasheet(PDF) 4 Page - Integrated Device Technology

Part # IDT71T75602S100BG
Description  512K x 36, 1M x 18 2.5V Synchronous ZBT??SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT71T75602S100BG Datasheet(HTML) 4 Page - Integrated Device Technology

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IDT71T75602, IDT71T75802, 512K x 36, 1M x 18, 2.5V Synchronous ZBT™ SRAMs with
2.5V I/O, Burst Counter, and Pipelined Outputs
Commercial and Industrial Temperature Ranges
Recommended Operating
Temperature and Supply Voltage
Pin Configuration — 512K x 36
NOTES:
1. Pins 14, 16, and 66 do not have to be connected directly to VDD as long as the input voltage is
≥ VIH.
2. Pins 38, 39 and 43 will be pulled internally to VDD if not actively driven. To disable the TAP controller without
interfering with normal operation, several settings are possible. Pins 38, 39 and 43 could be tied to VDD or VSS and pin
42 should be left unconnected. Or all JTAG inputs (TMS, TDI and TCK) pins 38, 39 and 43 could be left unconnected
“NC” and the JTAG circuit will remain disabled from power up.
3. Pin 43 is reserved for the 36M address. JTAG is not offered in the 100-pin TQFP package for the 36M ZBT device.
Top View
100 TQFP
Recommended DC Operating
Conditions
NOTE:
1. VIL (min.) = –0.8V for pulse width less than tCYC/2, once per cycle.
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
Core Supply Voltage
2.375
2.5
2.625
V
VDDQ
I/O Supply Voltage
2.375
2.5
2.625
V
VSS
Ground
0
0
0
V
VIH
Input High Voltage - Inputs
1.7
____
VDD +0.3
V
VIH
Input High Voltage - I/O
1.7
____
VDDQ+0.3
V
VIL
Input Low Voltage
-0.3(1)
____
0.7
V
5313 tbl 03
Grade
Ambient
Temperature(1)
VSS
VDD
VDDQ
Commercial
0° C to +70° C
OV
2.5V ± 5%
2.5V ± 5%
Industrial
-40° C to +85° C
OV
2.5V ± 5%
2.5V ± 5%
5313 tbl 05
100 999897 96 9594939291 90
87868584 83 82 81
89 88
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
I/O31
I/O30
VDDQ
VSS
I/O29
I/O28
I/O27
I/O26
VSS
VDDQ
I/O25
I/O24
VSS
VDD
I/O23
I/O22
VDDQ
VSS
I/O21
I/O20
I/O19
I/O18
VSS
VDDQ
I/O17
I/O16
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O14
VDDQ
VSS
I/O13
I/O12
I/O11
I/O10
VSS
VDDQ
I/O9
I/O8
VSS
VDD
I/O7
I/O6
VDDQ
VSS
I/O5
I/O4
I/O3
I/O2
VSS
VDDQ
I/O1
I/O0
5313 drw 02
VDD(1)
I/O15
I/OP3
VDD(1)
I/OP4
I/OP1
VDD(1)
I/OP2
ZZ
,
NOTE:
1. During production testing, the case temperature equals the ambient temperature.


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