A5191HRT

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2

BLOCK DIAGRAM

Figure 1. Block Diagram A5191HRT

Demodulator

Logic

Rx HP Filter

Rx Comp

Carrier Detect

Counter

Carrier Comp

Sine

Shaper

Numeric

Controlled

Oscillator

DEMODULATOR

MODULATOR

Crystal

Oscillator

BIAS

A5191HRT

RxAF

VDD

RxA

RxAFI

RxD

AREF

CDREF

TxA

CD

TxD

RTS

CBIAS

VDDA

VSS

VSSA

FSK_OUT

FSK_IN

XIN

XOUT

RESET

ELECTRICAL SPECIFICATIONS

Symbol

Parameter

Min

Max

Units

Ambient

−40

+85

°C

Storage Temperature

−55

150

°C

Junction Temperature

−40

150

°C

Supply Voltage

−0.3

6.0

V

DC Input, Output

−0.3

VDD + 0.3

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. CMOS devices are damaged by high−energy electrostatic discharge. Devices must be stored in conductive foam or with all pins shunted.

Precautions should be taken to avoid application of voltages higher than the maximum rating. Stresses above absolute maximum ratings

may result in damage to the device.

2. Remove power before insertion or removal of this device.