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K6T4016U3C-RB10 Datasheet(PDF) 8 Page - Samsung semiconductor

Part # K6T4016U3C-RB10
Description  256Kx16 bit Low Power and Low Voltage CMOS Static RAM
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Manufacturer  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

K6T4016U3C-RB10 Datasheet(HTML) 8 Page - Samsung semiconductor

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K6T4016V3C, K6T4016U3C Family
CMOS SRAM
Revision 2.01
October 2001
8
Address
CS
Data Valid
UB, LB
WE
Data in
Data out
High-Z
High-Z
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.
2. tCW is measured from the CS going low to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS or WE going high.
tWC
tCW(2)
tBW
tWP(1)
tDH
tDW
tWR(4)
tAW
DATA RETENTION WAVE FORM
CS controlled
VCC
3.0/2.7V1)
2.2V
VDR
CS
GND
Data Retention Mode
CS
≥VCC - 0.2V
tSDR
tRDR
tAS(3)
1. 3.0V for K6T4016V3C Family, 2.7V for K6T4016U3C Family


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