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K6T4016U3C-RB10 Datasheet(PDF) 8 Page - Samsung semiconductor |
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K6T4016U3C-RB10 Datasheet(HTML) 8 Page - Samsung semiconductor |
8 / 9 page K6T4016V3C, K6T4016U3C Family CMOS SRAM Revision 2.01 October 2001 8 Address CS Data Valid UB, LB WE Data in Data out High-Z High-Z TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled) NOTES (WRITE CYCLE) 1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi- tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write. 2. tCW is measured from the CS going low to the end of write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS or WE going high. tWC tCW(2) tBW tWP(1) tDH tDW tWR(4) tAW DATA RETENTION WAVE FORM CS controlled VCC 3.0/2.7V1) 2.2V VDR CS GND Data Retention Mode CS ≥VCC - 0.2V tSDR tRDR tAS(3) 1. 3.0V for K6T4016V3C Family, 2.7V for K6T4016U3C Family |
Similar Part No. - K6T4016U3C-RB10 |
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