07 | Keysight | N9080C and N9082C LTE and LTE-Advanced FDD/TDD X-Series Measurement App, Multi-Touch - Technical Overview

Measurement Summary

Required base station (eNB) RF transmitter measurements

3GPP TS36.141

paragraph #

Transmitter test

E-TM required

N9080C (FDD) & N9082C (TDD)

6.2

Base station output power

E-TM 1.1

6.3.2

Total power dynamic range

E-TM 2

E-TM 3.1

6.4

Transmit ON/OFF power

(TDD only)

E-TM1.1

6.5.1

Frequency error

E-TM 2

E-TM 3.1

6.5.2

Error vector magnitude

E-TM 3.2

E-TM 3.3

6.5.3

Time alignment error (TAE)

E-TM 1.1

6.5.4

DL RS power

E-TM 1.1

6.6.1

Occupied bandwidth

E-TM 1.1

Occupied BW

6.6.2

Adjacent channel leakage power ratio (ACLR)

E-TM 1.1

E-TM 1.2

ACP

6.6.2.6

Cumulative ACLR (LTE-Advanced only)

E-TM 1.1

E-TM 1.2

ACP

6.6.3

Operating band unwanted

emissions (SEM)

E-TM 1.1

E-TM 1.2

Spectrum emission mask

6.6.3

Cumulative mask for SEM

(LTE-Advanced only)

E-TM 1.1

E-TM 1.2

Spectrum emission mask

6.6.4

Transmitter spurious emission

E-TM 1.1

Spurious emissions

6.7

Transmitter intermodulation

E-TM 1.1

ACP, SEM, spurious emissions

1. All of the measurements are available for single carrier (LTE) or multiple-carrier LTE-Advanced with up to 5 component carriers. Option 1FP is LTE, Option

2FP is LTE-Advanced.

2. These are pre-demodulation channel power measurements. Channel power reading is also available after demodulation under “Error Summary” trace.

3. These measurements are available under “Error Summary” trace in Mod Analysis as well as under “Conformance EVM” measurement.

4. For LTE-Advanced, this measurement is supported for contiguous carrier aggregation and requires analysis bandwidth on X-Series signal analyzer wide

enough to cover the aggregated bandwidth.

5. “MIMO Summary”/”MIMO Info Table” traces are used to measure TAE for MIMO and Tx diversity signals. For carrier aggregation, “Cross-carrier Summary”

trace is used to measure TAE.

One-button standards-based measurements