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74LVC374A Datasheet(PDF) 3 Page - ON Semiconductor

Part # 74LVC374A
Description  Low-Voltage CMOS Octal D-Type Flip-Flop
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

74LVC374A Datasheet(HTML) 3 Page - ON Semiconductor

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74LVC374A
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3
MAXIMUM RATINGS
Symbol
Parameter
Condition
Value
Unit
VCC
DC Supply Voltage
−0.5 to +6.5
V
VI
DC Input Voltage
−0.5
≤ VI ≤ +6.5
V
VO
DC Output Voltage
Output in 3−State
−0.5
≤ VO ≤ +6.5
V
Output in HIGH or LOW State
(Note 1)
−0.5
≤ VO ≤ VCC + 0.5
V
IIK
DC Input Diode Current
VI < GND
−50
mA
IOK
DC Output Diode Current
VO < GND
−50
mA
VO > VCC
+50
mA
IO
DC Output Source/Sink Current
±50
mA
ICC
DC Supply Current Per Supply Pin
±100
mA
IGND
DC Ground Current Per Ground Pin
±100
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for
10 Seconds
TL = 260
°C
TJ
Junction Temperature Under Bias
TJ = 135
°C
qJA
Thermal Resistance (Note 2)
TSSOP
110.7
°C/W
MSL
Moisture Sensitivity
Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage Operating Functional
1.65
1.2
3.6
3.6
V
VI
Input Voltage
0
5.5
V
VO
Output Voltage
HIGH or LOW State
3−State
0
0
VCC
5.5
V
IOH
HIGH Level Output Current
VCC = 3.0 V − 3.6 V VCC = 2.7 V − 3.0 V
−24
−12
mA
IOL
LOW Level Output Current
VCC = 3.0 V − 3.6 V VCC = 2.7 V − 3.0 V
24
12
mA
TA
Operating Free−Air Temperature
−40
+125
°C
Dt/DV
Input Transition Rise or Fall Rate,
VCC = 1.65 to 2.7 V
VCC = 2.7 to 3.6 V
0
0
20
10
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.


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