6.42

IDT70V261S/L

High-Speed 16K x 16 Dual-Port Static RAM with Interrupt

Industrial and Commercial Temperature Ranges

6

AC Test Conditions

Figure 1. AC Output Test Load

NOTES:

1. Transition is measured 0mV from Low- or High-impedance voltage with Output Test Load (Figure 2).

2. This parameter is guaranteed by device characterization, but is not production tested.

4. 'X' in part number indicates power rating (S or L).

AC Electrical Characteristics Over the

Timing of Power-Up Power-Down

CE

3040 drw 05

,

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

3ns Max.

1.5V

1.5V

Figures 1 and 2

3040 tbl 10

3040 drw 04

590

Ω

30pF

435

Ω

3.3V

BUSY

INT

590

Ω

5pF*

435

Ω

3.3V

3040 drw 03

Figure 2. Output Test Load

* Including scope and jig.

70V261X25

Com'l

& Ind

70V261X35

Com'l Only

70V261X55

Com'l Only

Unit

Symbol

Parameter

Min.

Max.Min.Max.Min.

Max.

READ CYCLE

Read Cycle Time

25

____

35

____

55

____

ns

Address Access Time

____

25

____

35

____

55

ns

____

25

____

35

____

55

ns

____

25

____

35

____

55

ns

Output Enable Access Time

____

15

____

20

____

30

ns

Output Hold from Address Change

3

____

3

____

3

____

ns

3

____

3

____

3

____

ns

____

15

____

20

____

25

ns

0

____

0

____

0

____

ns

____

25

____

35

____

50

ns

Semaphore Flag Update Pulse (OE or SEM)15

____

15

____

15

____

ns

Semaphore Address Access Time

____

35

____

45

____

65

ns

3040 tbl 11