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70V9359L9PFG Datasheet(PDF) 7 Page - Integrated Device Technology |
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70V9359L9PFG Datasheet(HTML) 7 Page - Integrated Device Technology |
7 / 17 page 6.42 IDT70V9359/49L High-Speed 3.3V 8/4K x 18 Dual-Port Synchronous Pipelined Static RAM Industrial and Commercial Temperature Ranges 7 AC Test Conditions Figure 1. AC Output Test load. Figure 3. Typical Output Derating (Lumped Capacitive Load). 1 2 3 4 5 6 7 8 20 40 100 60 80 120 140 160 180 200 tCD1 , tCD2 (Typical, ns) Capacitance (pF) 5638 drw 06 -1 0 - 10pF is the I/O capacitance of this device, and 30pF is the AC Test Load Capacitance . Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels Output Load GND to 3.0V 2ns Max. 1.5V 1.5V Figures 1, 2, and 3 5638 tbl 10 5638 drw 05 590 Ω 30pF 435 Ω 3.3V DATAOUT 590 Ω 5pF* 435 Ω 3.3V DATAOUT 5638 drw 04 Figure 2. Output Test Load (For tCKLZ, tCKHZ, tOLZ, and tOHZ). *Including scope and jig. |
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