7

TLV314-Q1, TLV2314-Q1, TLV4314-Q1

www.ti.com

SBOS837 – NOVEMBER 2016

Product Folder Links: TLV314-Q1 TLV2314-Q1 TLV4314-Q1

Submit Documentation Feedback

Copyright © 2016, Texas Instruments Incorporated

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input pins are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails must be

current limited to 10 mA or less.

(3)

Short-circuit to ground, one amplifier per package.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted).

(1)

MIN

MAX

UNIT

Supply voltage

7

V

Signal input pins

(V–) – 0.5

(V+) + 0.5

V

–10

10

mA

Continuous

mA

Temperature

–40

125

°C

150

–65

150

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic discharge

±4000

V

Charged-device model (CDM), per AEC Q100-011

±1000

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

Supply voltage

Single-supply

1.8

5.5

V

Dual-supply

±0.9

±2.75

Specified temperature range

–40

125

°C