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OPA191 Datasheet(PDF) 20 Page - Texas Instruments |
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OPA191 Datasheet(HTML) 20 Page - Texas Instruments |
20 / 49 page Temperature (qC) Offset Voltage vs Temperature -50 -25 0 25 50 75 100 125 150 -100 -75 -50 -25 0 25 50 75 100 Temperature VOS Before e-trim VOS After e-trim Linear component of drift Linear component of drift 20 OPA191, OPA2191, OPA4191 SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016 www.ti.com Product Folder Links: OPA191 OPA2191 OPA4191 Submit Documentation Feedback Copyright © 2015–2016, Texas Instruments Incorporated 7 Parameter Measurement Information 7.1 Input Offset Voltage Drift The OPAx191 family of operational amplifiers is manufactured using TI’s e-trim technology. The e-trim technology is a TI proprietary method of trimming internal device parameters during either wafer probing or final testing. Each amplifier input offset voltage and input offset voltage drift is trimmed in production, thereby minimizing errors associated with input offset voltage and input offset voltage drift. When trimming input offset voltage drift, the systematic or linear drift error on each device is trimmed to zero. Figure 48 illustrates this concept. Figure 48. Input Offset Before and After Drift Trim A common method of specifying input offset voltage drift is the box method. The box method estimates a maximum input offset drift by bounding an offset voltage versus temperature curve with a box and using the corners of this bounding box to determine the drift. The slope of the line connecting the diagonal corners of the box corresponds to the input offset voltage drift. Figure 49 illustrates the box method concept. The box method works particularly well when the input offset drift is dominated by the linear component of drift, but because the OPA191 family uses TI’s e-trim technology to remove the linear component input offset voltage drift, the box method is not a particularly useful method of accurately performing an error analysis. Shown in Figure 49 are 30 typical units of OPAx191 with the box method superimposed for illustrative purposes. The boundaries of the box are determined by the specified temperature range along the x-axis and the maximum specified input offset voltage across that same temperature range along the y-axis. Using the box method predicts an input offset voltage drift of 0.9 µV/°C. As shown in Figure 49, the slopes of the actual input offset voltage versus temperature are much less than that predicted by the box method. The box method predicts a pessimistic value for the maximum input offset voltage drift and is not recommended when performing an error analysis. Figure 49. The Box Method |
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