OPA191_17 datasheet(20/49 Pages) TI1

Part #	OPA191

Description	Low Power, Precision, CMOS, Rail-to-Rail Input/Output, Low Offset Voltage, Low Input Bias Current Op Amp

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Manufacturer	TI1 [Texas Instruments]

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Temperature (qC)

Offset Voltage vs Temperature

-50

-25

0

25

50

75

100

125

150

-100

-75

-50

-25

0

25

50

75

100

Temperature

VOS Before e-trim

VOS After e-trim

Linear component of drift

20

OPA191, OPA2191, OPA4191

SBOS701A – DECEMEBER 2015 – REVISED APRIL 2016

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Product Folder Links: OPA191 OPA2191 OPA4191

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7 Parameter Measurement Information

7.1 Input Offset Voltage Drift

The OPAx191 family of operational amplifiers is manufactured using TI’s e-trim technology. The e-trim

technology is a TI proprietary method of trimming internal device parameters during either wafer probing or final

testing. Each amplifier input offset voltage and input offset voltage drift is trimmed in production, thereby

minimizing errors associated with input offset voltage and input offset voltage drift. When trimming input offset

voltage drift, the systematic or linear drift error on each device is trimmed to zero. Figure 48 illustrates this

concept.

Figure 48. Input Offset Before and After Drift Trim

A common method of specifying input offset voltage drift is the box method. The box method estimates a

maximum input offset drift by bounding an offset voltage versus temperature curve with a box and using the

corners of this bounding box to determine the drift. The slope of the line connecting the diagonal corners of the

box corresponds to the input offset voltage drift. Figure 49 illustrates the box method concept. The box method

works particularly well when the input offset drift is dominated by the linear component of drift, but because the

OPA191 family uses TI’s e-trim technology to remove the linear component input offset voltage drift, the box

method is not a particularly useful method of accurately performing an error analysis. Shown in Figure 49 are 30

typical units of OPAx191 with the box method superimposed for illustrative purposes. The boundaries of the box

are determined by the specified temperature range along the x-axis and the maximum specified input offset

voltage across that same temperature range along the y-axis. Using the box method predicts an input offset

voltage drift of 0.9 µV/°C. As shown in Figure 49, the slopes of the actual input offset voltage versus temperature

are much less than that predicted by the box method. The box method predicts a pessimistic value for the

maximum input offset voltage drift and is not recommended when performing an error analysis.

Figure 49. The Box Method

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