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LMC6032IM Datasheet(PDF) 9 Page - National Semiconductor (TI) |
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LMC6032IM Datasheet(HTML) 9 Page - National Semiconductor (TI) |
9 / 13 page Application Hints (Continued) BIAS CURRENT TESTING The test method of Figure 8 is appropriate for bench-testing bias current with reasonable accuracy. To understand its op- eration, first close switch S2 momentarily. When S2 is opened, then A suitable capacitor for C2 would be a 5 pF or 10 pF silver mica, NPO ceramic, or air-dielectric. When determining the magnitude of I b−, the leakage of the capacitor and socket must be taken into account. Switch S2 should be left shorted most of the time, or else the dielectric absorption of the ca- pacitor C2 could cause errors. Similarly, if S1 is shorted momentarily (while leaving S2 shorted) where C x is the stray capacitance at the + input. Typical Single-Supply Applications (V+ = 5.0 V DC) Additional single-supply applications ideas can be found in the LM358 datasheet. The LMC6032 is pin-for-pin compat- ible with the LM358 and offers greater bandwidth and input resistance over the LM358. These features will improve the performance of many existing single-supply applications. Note, however, that the supply voltage range of the LMC6032 is smaller than that of the LM358. if R1 = R5; R3 = R6, and R4 = R7. = 100 for circuit shown. For good CMRR over temperature, low drift resistors should be used. Matching of R3 to R6 and R4 to R7 affects CMRR. Gain may be adjusted through R2. CMRR may be adjusted through R7. DS011135-11 (Input pins are lifted out of PC board and soldered directly to components. All other pins connected to PC board.) FIGURE 7. Air Wiring DS011135-12 FIGURE 8. Simple Input Bias Current Test Circuit Instrumentation Amplifier DS011135-14 Sine-Wave Oscillator DS011135-15 Oscillator frequency is determined by R1, R2, C1, and C2: fOSC = 1/2πRC where R = R1 = R2 and C = C1 = C2. www.national.com 9 |
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