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AND8090 Datasheet(PDF) 2 Page - ON Semiconductor |
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AND8090 Datasheet(HTML) 2 Page - ON Semiconductor |
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2 / 20 page  AND8090/D http://onsemi.com 2 LAB TESTING Test Bench Overview Specialized test benches are used to determine the AC characteristics of the Device−Under−Test (DUT). A typical test bench setup for a differential device is shown in Figure 1. Test Initialization • The test cables are connected from the pulse generator to the appropriate DUT test board input connectors. • The test cables are connected from the DUT test board output connectors to the appropriate digital sampling oscilloscope input connectors. • The power supply cables are connected to the DUT test board power supply connectors. • The airflow regulator is set to 500 lfpm and the desired DUT ambient air temperature. The DUT is in this environment for a minimum of 3 minutes before testing begins. Data sheet specifications are typically given for −40 °C, 25°C, and 85°C. Q CHANNEL A (50 W) CHANNEL B (50 W) Q TRIGGER CHANNEL C (50 W) CHANNEL D (50 W) TRIGGER PULSE GENERATOR OSCILLOSCOPE VCC D D Q Q 50 W COAX VEE 50 W COAX 50 W COAX 50 W COAX 50 W COAX 50 W COAX Figure 1. AC Characterization Test Bench Setup Test Board |
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