10

Figure 10. Operating Circuit for Burn-In and Steady State Life Tests.

Figure 8. Test Circuit for t

Figure 9. Enable Propagation Delay vs. Temperature.

GND

VCC

+3.3 V

D.U.T.

IF = 13 mA

PULSE

GENERATOR

ZO = 50 Ω

tr = 5 ns

CL*

RL

* CL INCLUDES PROBE AND

STRAY WIRING CAPACITANCE.

VE

VOUT

OUTPUT VE

MONITORING

NODE

OUTPUT VO

MONITORING

NODE

0.01 μF

BYPASS

GND

VCC

D.U.T.*

TA = +125

* ALL CHANNELS TESTED SIMULTANEOUSLY.

VOC

CONDITIONS: IF = 20 mA

VCC

VIN

+-

(EACH OUTPUT)

(EACH INPUT)

IO = 25 mA

0.01 μF

200

Ω

5.3 V

(EACH OUTPUT)

+5.5 V

+5.5 V

200

Ω

0

10

20

30

40

50

60

70

80

-60 -40 -20 0 20 40 60 80 100 120 140