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VE1206L401R040 Datasheet(PDF) 4 Page - Kemet Corporation |
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VE1206L401R040 Datasheet(HTML) 4 Page - Kemet Corporation |
4 / 15 page 4 © KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com V0003_VE • 10/26/2016 SMD Varistors VE Series – SMD 150°C Low Voltage High Temperature Varistors Qualifications cont'd Reliability Parameter Test Tested According to Condition to be Satisfied after Testing Environmental and Storage Reliability Climatic Sequence CECC 42200, Test 4.16 or IEC 1051–1, Test 4.17. a) Dry heat, 16 hours, UCT, Test Ba, IEC 68–2–2 b)Dampheat,cyclic,thefirstcycle:55°C,93%RH, 24 hours, Test Db 68–2–4 c) Cold, LCT, 2 hours Test Aa IEC 68–2–1 d)Dampheatcyclic,remaining5cycles:55°C,93% RH, 24 hour/cycle, Test Bd, IEC 68–2–30 |δ Vn (1 mA)| < 10 % Thermal Shock CECC 42200, Test 4.12, Test Na, IEC 68–2–14, AEC–Q200 Test 16, 5 cycles UCT/LCT, 30 minutes |δ Vn (1 mA)| < 10 % no visible damage Steady State Damp Heat CECC 42200, Test 4.17, Test Ca, IEC 68–2–3, AEC–Q200Test6,56days,40°C,93%RH.AEC–Q200 Test7: Bias, Rh, T all at 85. |δ Vn (1 mA)| < 10 % Storage Test IEC 68–2–2, Test Ba, AEC–Q200 Test 3, 1,000 hours at maximum storage temperature |δ Vn (1 mA)| < 5 % Mechanical Reliability Solderability CECC 42200, Test 4.10.1, Test Ta IEC 68–2–20 solderbathandreflowmethod Solderable at shipment and after 2 year of storage, criteria > 95% must be coveredbysolderforreflow meniscus Resistance to Soldering Heat CECC 42200, Test 4.10.2, Test Tb, IEC 68–2–20 solder bathandreflowmethod |δ Vn (1 mA)| < 5 % Terminal Strength JIS–C–6429, App. 1, 18N for 60 seconds – same for AEC–Q200 Test 22 no visual damage Board Flex JIS–C–6429, App. 2, 2 mm minimum AEC–Q200test21–Boardflex:2mmflexminimum |δ Vn (1 mA)| < 2 % no visible damage Vibration CECC 42200, Test 4.15, Test Fc, IEC 68–2–6, AEC– Q200 Test 14. Frequency range 10 to 55 Hz (AEC: 10 – 2,000 Hz) Amplitude 0.75 m/s2 or 98 m/s2 (AEC: 5 g's for 20 minutes) Total duration 6 hours (3x2h) (AEC: 12 cycles each of 3 directions) Waveshape – half sine |δ Vn (1 mA)| < 10 % no visible damage Mechanical Shock CECC 42200, Test 4.14, Test Ea, IEC 68–2–27, AEC–Q200 Test 13. Acceleration = 490 m/s2 (AEC: MIL-STD–202–Method 213), Pulse duration = 11 ms, Waveshape – half sine; Number of shocks = 3x6 |δ Vn (1 mA)| < 10 % no visible damage Electrical Transient Conduction ISO–7637–1 Pulses AEC–Q200 Test 30: Test pulses 1 to 3. Also other pulses – freestyle. |δ Vn (1 mA)| < 10 % no visible damage |
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