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DP8404D Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # DP8404D
Description  DP8402A/DP8403/DP8404/DP8405 32-Bit Parallel Error Detection and Correction Circuits (EDACs)
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP8404D Datasheet(HTML) 3 Page - National Semiconductor (TI)

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Mode Definitions
DESCRIPTION
PIN NAME
MODE
S1
S0
MODE
OPERATION
0
L
L
WRITE
Input dataword and output
checkword
1
L
H
DIAGNOSTICS
Input various data words
against latched
checkwordoutput valid
error flags
2
H
L
READ
FLAG
Input dataword and output
error flags
3
H
H
CORRECT
Latched input data and
checkwordoutput
corrected data and
syndrome code
Pin Definitions
S0 S1
Control of EDAC mode see preceding
Mode Definitions
DB0 thru DB31 IO port for 32 bit dataword
CB0 thru CB6
IO port for 7 bit checkword Also output
port for the syndrome error code during
error correction mode
OEB0 thru
Dataword output buffer enable When high
OEB3
output buffers are at TRI-STATE Each pin
(DP8402A
controls 8 IO ports OEB0 controls DB0
DP8403)
thru DB7 OEB1 controls DB8 thru DB15
OEB2 controls DB16 thru DB23 and OEB3
controls DB24 thru DB31
LEDBO
Data word output Latch enable When high
(DP8402A
it inhibits input to the Latch Operates on all
DP8403)
32 bits of the dataword
OEDB
TRI-STATE control for the data IO port
(DP8404
When high output buffers are at
DP8405)
TRI-STATE
OECB
Checkword output buffer enable When
high the output buffers are in TRI-STATE
mode
ERR
Single error output flag a low indicates at
least a single bit error
MERR
Multiple error output flag a low indicates
two or more errors present
PCC Pin Definitions DP8402A
pin 1
VCC
pin 35
OECB
2
LEDBO
36
CB3
3
MERR
37
CB2
4
ERR
38
CB1
5
DB0
39
CB0
6
DB1
40
DB16
7
DB2
41
DB17
8NC
42
NC
9NC
43
NC
10
NC
44
DB18
11
DB3
45
DB19
12
DB4
46
DB20
13
DB5
47
DB21
14
OEBO
48
OEB2
15
DB6
49
DB22
16
DB7
50
DB23
17
GND
51
GND
18
GND
52
GND
19
DB8
53
DB24
20
DB9
54
DB25
21
OEB1
55
OEB3
22
DB10
56
DB26
23
DB11
57
DB27
24
DB12
58
DB28
25
DB13
59
NC
26
DB14
60
NC
27
NC
61
NC
28
NC
62
NC
29
NC
63
DB29
30
DB15
64
DB30
31
NC
65
DB31
32
CB6
66
S0
33
CB5
67
S1
34
CB4
68
VCC
TABLE I Write Control Function
Memory
EDAC
Control
DB Control
DB Output Latch
CB
Error Flags
Cycle
Function
S1
S0
Data IO
OEBn or
DP8402A DP8403
Check IO
Control
ERR
MERR
OEDB
LEDBO
OECB
Write
Generate
L
L
Input
H
X
Output
LH
H
check word
check bits
See Table II for details on check bit generation
Memory Write Cycle Details
During a memory write cycle the check bits (CB0 thru CB6)
are generated internally in the EDAC by seven 16-input pari-
ty generators using the 32-bit data word as defined in Table
2 These seven check bits are stored in memory along with
the original 32-bit data word This 32-bit word will later be
used in the memory read cycle for error detection and cor-
rection
3


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