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UCD9240PFC Datasheet(PDF) 5 Page - Texas Instruments |
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UCD9240PFC Datasheet(HTML) 5 Page - Texas Instruments |
5 / 39 page ADC MONITORING INTERVALS AND RESPONSE TIMES UCD9240 www.ti.com................................................................................................................................................... SLUS766C – JULY 2008 – REVISED NOVEMBER 2008 The ADC operates in a continuous conversion sequence that measures each rail's output voltage, each power stage's ouput current, plus four other variables (external temperature, Internal temperature, input voltage and current, and tracking input voltage). The length of the sequence is determined by the number of output rails (NumRails) and total output power stages (NumPhases) configured for use. The time to complete the monitoring sampling sequence is give by the formula: tADC_SEQ = tADC × (NumRAILS + NumPHASE + 4) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tADC ADC single-sample time 3.84 µs Min = 1 Rail + 1 Phase + 4 = 6 samples tADC_SEQ ADC sequencer interval 23.04 61.44 µs Max = 4 Rails + 8 Phases + 4 = 16 samples The most recent ADC conversion results are periodically converted into the proper measurement units (volts, amperes, degrees), and each measurement is compared to its corresponding fault and warning limits. The monitoring operates asynchronously to the ADC, at intervals shown in the table below. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tVout Output voltage monitoring interval 200 µs 200 × tIout Output current monitoring interval µs NRails tVin Input voltage monitoring interval 2 ms tIin Input current monitoring interval 2 ms tTEMP Temeprature monitoring interval 800 ms tIbal Output current balancing interval 2 ms tFanTach Fan speed monitoring interval 1000 ms Because the ADC sequencer and the monitoring comparisons are asynchronous to each other, the response time to a fault condition depends on where the event occurs within the monitoring interval and within the ADC sequence interval. Once a fault condition is detected, some additional time is required to determine the correct action based on the FAULT_RESPONSE code, and then to perform the appropriate response. The following table lists the worse-case fault response times. PARAMETER TEST CONDITIONS MAX TIME UNIT Over/under voltage fault response time during Normal regulation, no PMBus activity, tOVF, tUVF 300 µs normal operation 8 stages enabled Over/under voltage fault response time, during data During data logging to nonvolatile tOVF, tUVF 800 µs logging memory(1) Over/under voltage fault response time, when tOVF, tUVF During tracking and soft-start ramp. 400 µs tracking or sequencing enable Normal regulation, no PMBus activity, Over/under current fault response time during (2)100 + (600 x tOCF, tUCF 8 stages enabled µs normal operation NRails) 75% to 125% current step During data logging to nonvolatile Over/under current fault response time, during data 600 + (600 x tOCF, tUCF memory µs logging NRails) 75% to 125% current step Over/under current fault response time, when During tracking and soft start ramp 300 + (600 x tOCF, tUCF µs tracking or sequencing enable 75% to 125% current step NRails) Temperature rise of 10 °C/sec, OT tOTF Overtemperature fault response time 5 s threshold = 100 °C (1) During a STORE_DEFAULT_ALL command, which stores the entire configuration to nonvolatile memory, the fault detection latency can be up to 10 ms. (2) Because the current measurement is averaged with a smoothing filter, the response time to an Overcurrent condition depends on a combination of the time constant ( τ) from Table 4, the recent measurement history, and how much the measured value exceeds the overcurrent limit. Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): UCD9240 |
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