2

AT-31011, AT-31033 Absolute Maximum Ratings

Symbol

Parameter

Units

Emitter-Base Voltage

V

1.5

Collector-Base Voltage

V

11

Collector-Emitter Voltage

V

5.5

Collector Current

mA

16

mW

150

Junction Temperature

°C

150

Storage Temperature

°C

-65 to 150

Notes:

1. Operation of this device above any one of these parameters may cause permanent damage.

AT-31011

AT-31033

Symbol

Parameters and Test Conditions

Units

Min

Typ

Max

Min

Typ

Max

NF

Noise Figure

f = 0.9 GHz

dB

Associated Gain

f = 0.9 GHz

dB

Forward Current

-

70

300

70

300

Transfer Ratio

Collector Cutoff Current

µA

0.05

0.2

0.05

0.2

Emitter Cutoff Current

µA

0.1

1.5

0.1

1.5

Notes:

1. Test circuit B, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.4 dB; output loss = 0.4 dB.

2. Test circuit A, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.4 dB; output loss = 0.4 dB.

Figure 1. Test Circuit for Noise Figure and Associated Gain. This Circuit is a Compromise Match Between Best Noise Fig-

ure, Best Gain, Stability, a Practical, Synthesizable Match, and a Circuit Capable of Matching Both the AT-305 and AT-310

Geometries.

AT-31011 fig 1

1000 pF

W = 10 L = 1860

W = 10 L = 1000

W = 30 L = 100

W = 30 L = 100

W = 10 L = 1860

1000 pF

25

Ω

W = 10 L = 1025

TEST CIRCUIT A: W = 20 L = 100

TEST CIRCUIT B: W = 20 L = 200 x 2

NOT TO SCALE

TEST CIRCUIT

BOARD MATL = 0.062" FR-4 (

ε = 4.8)

DIMENSIONS IN MILS