CM1293A-04SO datasheet(1/6 Pages) ONSEMI

Part #	CM1293A-04SO

Description	4-Channel Low Capacitance ESD Protection Array

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Manufacturer	ONSEMI [ON Semiconductor]

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 Semiconductor Components Industries, LLC, 2012

January, 2012 − Rev. 0

1

Publication Order Number:

CM1293A−04SO/D

CM1293A-04SO

4-Channel

Low Capacitance

ESD Protection Array

Product Description

CM1293A−04SO has been designed to provide ESD protection for

electronic components or subsystems requiring minimal capacitive

loading. This device is ideal for protecting systems with high data and

clock rates or for circuits requiring low capacitive loading. Each ESD

channel consists of a pair of diodes in series that steer the positive or

negative ESD current pulse to either the positive (VP) or negative (VN)

supply rail. A Zener diode is embedded between VP and VN which

helps protect the VCC rail against ESD strikes. This device protects

against ESD pulses up to 8 kV contact discharge) per the

IEC 61000−4−2Level 4 standard.

This device is particularly well−suited for protecting systems using

high−speed ports such as USB2.0, IEEE1394 (FireWire, i.LINK

t),

Serial ATA, DVI, HDMI, and corresponding ports in removable

storage, digital camcorders, DVD−RW drives and other applications

where extremely low loading capacitance with ESD protection are

required in a small package footprint.

Features

 Four Channels of ESD Protection

 Provides ESD Protection to IEC61000−4−2



8 kV Contact Discharge

 Low Loading Capacitance of 2.0 pF Max

 Low Clamping Voltage

 Channel I/O to I/O Capacitance 1.5 pF Typical

 Zener Diode Protects Supply Rail and Eliminates the Need for

External By−Pass Capacitors

 Each I/O Pin Can Withstand over 1000 ESD Strikes*

 This Device is Pb−Free and is RoHS Compliant**

Applications

 DVI Ports, HDMI Ports in Notebooks, Set Top Boxes, Digital TVs,

LCD Displays

 Serial ATA Ports in Desktop PCs and Hard Disk Drives

 PCI Express Ports

 General Purpose High−Speed Data Line ESD Protection

**Standard test condition is IEC61000−4−2 level 4 test circuit with each pin

subjected to 8 kV contact discharge for 1000 pulses. Discharges are timed at

1 second intervals and all 1000 strikes are completed in one continuous test run.

The part is then subjected to standard production test to verify that all of the

tested parameters are within spec after the 1000 strikes.

**For additional information on our Pb−Free strategy and soldering details,

please download the ON Semiconductor Soldering and Mounting Techniques

Reference Manual, SOLDERRM/D.

MARKING DIAGRAM

Device

Package

Shipping†

ORDERING INFORMATION

http://onsemi.com

SC−74

(Pb−Free)

3,000 /

Tape & Reel

CM1293A−04SO

†For information on tape and reel specifications,

including part orientation and tape sizes, please

refer to our Tape and Reel Packaging Specification

Brochure, BRD8011/D.

SC−74

SO SUFFIX

CASE 318F

BLOCK DIAGRAM

CH2

CH1

CH3

CH4

VN

VP

CM1293A−04SO

1

XXXMG

G

XXX

= Specific Device Code

M

= Date Code

G

= Pb−Free Package

(Note: Microdot may be in either location)

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