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BQ294533 Datasheet(PDF) 11 Page - Texas Instruments |
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BQ294533 Datasheet(HTML) 11 Page - Texas Instruments |
11 / 26 page OUT VDD VSS 1 3 2 6 4 5 .6 3 V I IN I IN I IN I CC bq2945xx V3 V1 V2 PWRPAD 3 V .6 3 V 3 V .6 3 V 3 V VOV VOV–VHYS OUT (V) tDELAY > 10 ms 10 V 11 bq294502, bq294504, bq294512, bq294514 bq294515, bq294522, bq294524, bq294532 bq294533, bq294562, bq294572, bq294582, bq294592 www.ti.com SLUSAJ3F – SEPTEMBER 2011 – REVISED JUNE 2017 Product Folder Links: bq294502 bq294504 bq294512 bq294514 bq294515 bq294522 bq294524 bq294532 bq294533 bq294562 bq294572 bq294582 bq294592 Submit Documentation Feedback Copyright © 2011–2017, Texas Instruments Incorporated Device Functional Modes (continued) 8.4.3 Customer Test Mode Customer Test Mode (CTM) helps to reduce test time for checking the overvoltage delay timer parameter once the circuit is implemented in the battery pack. To enter CTM, VDD should be set to at least 10 V higher than V3 (see Figure 7). The delay timer is greater than 10 ms, but considerably shorter than the timer delay in normal operation. To exit CTM, remove the VDD to VC3 voltage differential of 10 V so that the decrease in this value automatically causes an exit. CAUTION Avoid exceeding any Absolute Maximum Voltages on any pins when placing the part into CTM. Also avoid exceeding Absolute Maximum Voltages for the individual cell voltages (V3–V2), (V2–V1), and (V1–VSS). Stressing the pins beyond the rated limits may cause permanent damage to the device. Figure 7 shows the timing for CTM. Figure 7. Timing for Customer Test Mode Figure 8 shows the measurement for current consumption for the product for both VDD and Vx. Figure 8. Configuration for IC Current Consumption Test |
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