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TCAN1051VDQ1 Datasheet(PDF) 5 Page - Texas Instruments |
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TCAN1051VDQ1 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 38 page 5 TCAN1051-Q1, TCAN1051V-Q1, TCAN1051H-Q1 TCAN1051HV-Q1, TCAN1051G-Q1, TCAN1051GV-Q1 TCAN1051HG-Q1, TCAN1051HGV-Q1 www.ti.com SLLSET0C – OCTOBER 2016 – REVISED MAY 2017 Product Folder Links: TCAN1051-Q1 TCAN1051V-Q1 TCAN1051H-Q1 TCAN1051HV-Q1 TCAN1051G-Q1 TCAN1051GV-Q1 TCAN1051HG-Q1 TCAN1051HGV-Q1 Submit Documentation Feedback Copyright © 2016–2017, Texas Instruments Incorporated (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated condition for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal. 7 Specifications 7.1 Absolute Maximum Ratings (1) (2) MIN MAX UNIT VCC 5-V Bus Supply Voltage Range All Devices –0.3 7 V VIO I/O Level-Shifting Voltage Range Devices with the "V" Suffix –0.3 7 V VBUS CAN Bus I/O voltage range (CANH, CANL) Devices without the "H" Suffix –58 58 V V(Diff) Max differential voltage between CANH and CANL Devices without the “H” suffix –58 58 V VBUS CAN Bus I/O voltage range (CANH, CANL) Devices with the "H" Suffix -70 70 V V(Diff) Max differential voltage between CANH and CANL Devices with the “H” suffix –70 70 V V(Logic_Input) Logic input terminal voltage range (TXD, S) All Devices –0.3 +7 and VI ≤ VIO + 0.3 V V(Logic_Output) Logic output terminal voltage range (RXD) –0.3 +7 and VI ≤ VIO + 0.3 V IO(RXD) RXD (Receiver) output current –8 8 mA TJ Virtual junction temperature range (see Thermal Information) –55 150 °C TSTG Storage temperature range (see Thermal Information) –65 150 °C (1) Tested in accordance to JEDEC Standard 22, Test Method A114. (2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus is stressed with respect to GND. (3) Tested in accordance to JEDEC Standard 22, Test Method C101. (4) Tested in accordance to JEDEC Standard 22, Test Method A115. (5) ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results. 7.2 ESD Ratings TEST CONDITIONS VALUE UNIT D (SOIC) Package Human Body Model (HBM) ESD stress voltage All terminals(1) ±6000 V CAN bus terminals (CANH, CANL) to GND(2) ±16000 Charged Device Model (CDM) ESD stress voltage All terminals(3) ±1500 V Machine Model All terminals(4) ±200 V System Level Electro-Static Discharge (ESD) CAN bus terminals (CANH, CANL) to GND SAE J2962-2 per ISO 10605: Powered Air Discharge ±15000 V SAE J2962-2 per ISO 10605: Powered Contact Discharge ±8000 System Level Electro-Static Discharge (ESD) CAN bus terminals (CANH, CANL) to GND IEC 61000-4-2: Unpowered Contact Discharge ±15000 V IEC 61000-4-2: Powered Contact Discharge ±8000 System Level Electrical fast transient (EFT) CAN bus terminals (CANH, CANL) to GND IEC 61000-4-4: Criteria A ±4000 V ISO7637 Transients according to GIFT - ICT CAN EMC test spec(5) CAN bus terminals (CANH, CANL) to GND Pulse 1 –100 V Pulse 2 +75 Pulse 3a –150 Pulse 3b +100 ISO7637-3 Transients CAN bus terminals (CANH, CANL) to GND Direct Coupling Capacitor "Slow Transient Pulse" with100 nF coupling capacitor - Powered ±85 V DRB (VSON) Package Human Body Model (HBM) ESD stress voltage All terminals(1) ±6000 V CAN bus terminals (CANH, CANL) to GND(2) ±16000 Charged Device Model (CDM) ESD stress voltage All terminals(3) ±1500 V |
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