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VND5E006ASP-E Datasheet(PDF) 17 Page - STMicroelectronics

Part # VND5E006ASP-E
Description  Double channel high-side driver with analog current sense for automotive applications
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

VND5E006ASP-E Datasheet(HTML) 17 Page - STMicroelectronics

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DocID17362 Rev 6
17/37
VND5E006ASP-E
Electrical specifications
36
Table 12. Electrical transient requirements (part 1/3)
ISO 7637-2:
2004(E)
Test Pulse
Test levels(1)
1.
The above test levels must be considered referred to VCC = 13.5 V except for pulse 5b.
Number of
pulses or
test times
Burst cycle/pulse
repetition time
Delays and
impedance
III
IV
1
-75 V
-100 V
5000
pulses
0.5 s
5 s
2 ms, 10
Ω
2a
+37 V
+50 V
5000
pulses
0.2 s
5 s
50
μs, 2 Ω
3a
-100 V
-150 V
1h
90 ms
100 ms
0.1
μs, 50 Ω
3b
+75 V
+100 V
1h
90 ms
100 ms
0.1
μs, 50 Ω
4
-6 V
-7 V
1 pulse
100 ms, 0.01
Ω
5b(2)
2.
Valid in case of external load dump clamp: 40V maximum referred to ground. The protection strategy
allows PowerMOS to be cyclically switched on during load dump, so distributing the load dump energy
along the time and to transfer a part of it to the load.
+65 V
+87 V
1 pulse
400 ms, 2
Ω
Table 13. Electrical transient requirements (part 2/3)
ISO 7637-2:
2004(E)
Test Pulse
Test level results(1)
1.
The above test levels must be considered referred to VCC = 13.5 V except for pulse 5b.
III
IV
1C
C
2a
C
C
3a
C
C
3b
C
C
4C
C
5b(2)(3)
2.
Valid in case of external load dump clamp: 40V maximum referred to ground. The protection strategy
allows PowerMOS to be cyclically switched on during load dump, so distributing the load dump energy
along the time and to transfer a part of it to the load.
3.
Suppressed load dump (pulse 5b) is withstood with a minimum load connected as specified in
Table 3: Absolute maximum ratings.
CC
Table 14. Electrical transient requirements (part 3/3)
Class
Contents
C
All functions of the device are performed as designed after exposure to disturbance.
E
One or more functions of the device are not performed as designed after exposure
to disturbance and cannot be returned to proper operation without replacing the


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