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DS21Q58 Datasheet(PDF) 3 Page - Maxim Integrated Products |
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DS21Q58 Datasheet(HTML) 3 Page - Maxim Integrated Products |
3 / 3 page The calculated failure rate for this device/process is: The parameters used to calculate this failure rate are as follows: Cf: 60% Ea: 0.7 B: 0 Tu: 25 Vu: 5.5 °C Volts The reliability data follows. A the start of this data is the device information. The next section is the detailed reliability data for each stress. The reliability data section includes the latest data available. Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. FITS: 3.3 MTTF (YRS): 34521 FAILURE RATE: Device Information: Process: E6H-2P2M,HPVt,TCZ ALOCOS:GOI Number of Transistors: 1 Passivation: Passivation w/OxyNitride-Nov. 4% PSG Die Size: 416 x 405 Interconnect: Aluminum / 1% Silicon / 0.5% Copper Gate Oxide Thickness: 150 Å ELECTRICAL CHARACTERIZATION DESCRIPTION READPOINT CONDITION QUANTITY FAILS DATE CODE 1 EOS/ESD S5.1 HBM 500 VOLTS 3 0 ESD SENSITIVITY PUL'S 0418 1 EOS/ESD S5.1 HBM 1000 VOLTS 3 0 ESD SENSITIVITY PUL'S 0418 1 EOS/ESD S5.1 HBM 2000 VOLTS 3 0 ESD SENSITIVITY PUL'S 0418 1 EOS/ESD S5.1 HBM 4000 VOLTS 3 3 ESD SENSITIVITY PUL'S 0418 1 EOS/ESD S5.1 HBM 8000 VOLTS 3 3 ESD SENSITIVITY PUL'S 0418 JESD78, I-TEST 125C 6 0 LATCH-UP 0418 JESD78, Vsupply TEST 125C 6 0 LATCH-UP 0418 6 Total: OPERATING LIFE DESCRIPTION READPOINT CONDITION QUANTITY FAILS DATE CODE 1000 125C, 6.0 VOLTS 80 0 HIGH VOLTAGE LIFE HRS 0310 1000 125C, 5.25 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0332 1000 125C, 5.25 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0336 1000 125C, 3.5 VOLTS 45 0 HIGH TEMP OP LIFE HRS 0402 192 125C, 5.0 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0418 0 Total: FITS: 3.3 MTTF (YRS): 34521 FAILURE RATE: |
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