The calculated failure rate for this device/process is:

The parameters used to calculate this failure rate are as follows:

Cf: 60%

Ea: 0.7

B: 0

Tu: 25

Vu: 5.5

°C

Volts

The reliability data follows. A the start of this data is the device information. The next section is the

detailed reliability data for each stress. The reliability data section includes the latest data available.

Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT

rate is related to MTTF by:

MTTF = 1/Fr

NOTE: MTTF is frequently used interchangeably with MTBF.

FITS:

3.3

MTTF (YRS): 34521

FAILURE RATE:

Device Information:

Process:

E6H-2P2M,HPVt,TCZ ALOCOS:GOI

Number of Transistors:

1

Passivation:

Passivation w/OxyNitride-Nov. 4% PSG

Die Size:

416 x 405

Interconnect:

Aluminum / 1% Silicon / 0.5% Copper

Gate Oxide Thickness:

150 Å

ELECTRICAL CHARACTERIZATION

DESCRIPTION

READPOINT

CONDITION

QUANTITY

FAILS

DATE CODE

1

EOS/ESD S5.1 HBM 500 VOLTS

3

0

ESD SENSITIVITY

PUL'S

0418

1

EOS/ESD S5.1 HBM 1000 VOLTS

3

0

ESD SENSITIVITY

PUL'S

0418

1

EOS/ESD S5.1 HBM 2000 VOLTS

3

0

ESD SENSITIVITY

PUL'S

0418

1

EOS/ESD S5.1 HBM 4000 VOLTS

3

3

ESD SENSITIVITY

PUL'S

0418

1

EOS/ESD S5.1 HBM 8000 VOLTS

3

3

ESD SENSITIVITY

PUL'S

0418

JESD78, I-TEST 125C

6

0

LATCH-UP

0418

JESD78, Vsupply TEST 125C

6

0

LATCH-UP

0418

6

Total:

OPERATING LIFE

DESCRIPTION

READPOINT

CONDITION

QUANTITY

FAILS

DATE CODE

1000

125C, 6.0 VOLTS

80

0

HIGH VOLTAGE LIFE

HRS

0310

1000

125C, 5.25 VOLTS

77

0

HIGH TEMP OP LIFE

HRS

0332

1000

125C, 5.25 VOLTS

77

0

HIGH TEMP OP LIFE

HRS

0336

1000

125C, 3.5 VOLTS

45

0

HIGH TEMP OP LIFE

HRS

0402

192

125C, 5.0 VOLTS

77

0

HIGH TEMP OP LIFE

HRS

0418

0

Total:

FITS:

3.3

MTTF (YRS): 34521

FAILURE RATE: