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ADN2849ACP-RL Datasheet(PDF) 2 Page - Analog Devices

Part # ADN2849ACP-RL
Description  10.7 Gbps Electro-Absorption Modulator Driver
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADN2849ACP-RL Datasheet(HTML) 2 Page - Analog Devices

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ADN2849
Rev. Pr. G | Page 2 of 17
Specifications
(Electrical Specifications (VEE=VEEMIN to VEEMAX . All specifications Tmin to Tmax, ZL=50Ω unless otherwise noted. Typical values
specified at 250C)
Table 1.
Parameter
Min
Typ
Max
Unit
Conditions
Bias Offset Voltage(MODP)
Bias offset voltage
-0.25
-2.0
V
Note 1
BIAS_SET voltage to bias offset voltage gain
0.9
1.1
V/V
Ta=250C, VEE=-5.2V
Bias offset voltage drift over temperature and VEE
-5
5
%
Modulation Voltage(MODP)
Modulation voltage swing
0.6
3.0
V
Note1
MOD_SET voltage to modulation voltage swing gain
1.5
1.9
V/v
Ta=250C, VEE=-5.2V
Modulation voltage drift over temperature and VEE
-5
5
%
Back termination resistance
40
60
Rise time (20% - 80%)
27
36
ps
Fall time (20% - 80%)
27
36
ps
Random jitter
0.75
ps RMS
Total jitter
10
psp-p
Cross point adjust range
30
85
%
Cross point drift over temperature and VEE
-5
5
%
Minimum output voltage(single ended)
VEE+1.7
V
Note1
|S22|
-8
dB
At 10GHz
Modulation enable time
100
ns
Modulation disable time
100
ns
Data Inputs (DATAP, DATAN)
Differential Input voltage
600
1600
mVp-p
Termination resistance
40
60
Setup time (see figure 2)
25
ps
CLK_SELB=’0’
Hold time (see figure 2)
25
ps
CLK_SELB=’0’
|S11|
-10
DB
At 10GHz
Clock Inputs (CLKP, CLKN)
Differential Input voltage
600
1600
mVp-p
Termination resistance
40
60
|S11|
-10
dB
At 10GHz
Cross point adjust (CPAN, CPAP)
Input voltage range
-0.85
-1.85
V
CPAP, CPAN differential voltage
0.6
Vp-p
Input current
85
115
µA
Logic Inputs (MOD_ENB, CLK_SELB)
VIH
VEE+2
V
VIL
VEE+0.8
V
IIL
-400
µA
VI=VEE+0.4V
IIH
20
µA
VI=VEE+2.4V
200
µA
VI=0V
Supply
VEE
-4.75
-5.2
-5.5
V
IMOD=0
IEE
52
mA
VMODP/MODN=0
Notes:
Minimum supply voltage and minimum output voltage determine maximum output swing and maximum bias offset that can be achieved concurrently.
Measured using the characterization circuit shown in figure 3.
Preliminary Technical Data


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