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WSF128K16-37G1UI Datasheet(PDF) 4 Page - List of Unclassifed Manufacturers

Part # WSF128K16-37G1UI
Description  128K X 16 SRAM /FLASH MODULE SMD 5962-96900
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Manufacturer  ETC [List of Unclassifed Manufacturers]
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WSF128K16-37G1UI Datasheet(HTML) 4 Page - List of Unclassifed Manufacturers

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White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
WSF128K16-XXX
Parameter
Symbol
-35
-70
Unit
Read Cycle
Min Max
Min Max
Read Cycle Time
tRC
35
70
ns
Address Access Time
tAA
35
70
ns
OutputHoldfromAddressChange
tOH
03
ns
Chip Select Access Time
tACS
35
70
ns
Output Enable to Output Valid
tOE
20
35
ns
Chip Select to Output in Low Z
tCLZ1
33
ns
Output Enable to Output in Low Z
tOLZ1
00
ns
Chip Disable to Output in High Z
tCHZ1
20
25
ns
Output Disable to Output in High Z
tOHZ1
20
25
ns
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
-35
-70
Unit
Write Cycle
Min Max
Write Cycle Time
tWC
35
70
ns
Chip Select to End of Write
tCW
25
60
ns
Address Valid to End of Write
t AW
25
60
ns
Data Valid to End of Write
tDW
20
30
ns
Write Pulse Width
tWP
25
50
ns
Address Setup Time
tAS
05
ns
Address Hold Time
tAH
05
ns
Output Active from End of Write
tOW1
45
ns
Write Enable to Output in High Z
tWHZ1
20
25
ns
Data Hold from Write Time
tDH
00
ns
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
FIG. 3 AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
1. This parameter is guaranteed by design but not tested.
1. This parameter is guaranteed by design but not tested.


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